{"title":"大面积太阳能电池局部照射诊断","authors":"J. Radil, V. Benda","doi":"10.1109/ICMEL.2000.840556","DOIUrl":null,"url":null,"abstract":"This paper presents a method for determining of local defects, which bring down efficiency and reliability of solar cells, using local irradiation of the surface of large-area solar cells. The method can give information about position and extent of local defects. Photovoltaic voltage generated by local irradiation is decreased in the area of local defects and so local defects can be determined.","PeriodicalId":215956,"journal":{"name":"2000 22nd International Conference on Microelectronics. Proceedings (Cat. No.00TH8400)","volume":"39 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2000-05-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"Diagnostics of large-area solar cells by local irradiation\",\"authors\":\"J. Radil, V. Benda\",\"doi\":\"10.1109/ICMEL.2000.840556\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents a method for determining of local defects, which bring down efficiency and reliability of solar cells, using local irradiation of the surface of large-area solar cells. The method can give information about position and extent of local defects. Photovoltaic voltage generated by local irradiation is decreased in the area of local defects and so local defects can be determined.\",\"PeriodicalId\":215956,\"journal\":{\"name\":\"2000 22nd International Conference on Microelectronics. Proceedings (Cat. No.00TH8400)\",\"volume\":\"39 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2000-05-14\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2000 22nd International Conference on Microelectronics. Proceedings (Cat. No.00TH8400)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICMEL.2000.840556\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2000 22nd International Conference on Microelectronics. Proceedings (Cat. No.00TH8400)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICMEL.2000.840556","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Diagnostics of large-area solar cells by local irradiation
This paper presents a method for determining of local defects, which bring down efficiency and reliability of solar cells, using local irradiation of the surface of large-area solar cells. The method can give information about position and extent of local defects. Photovoltaic voltage generated by local irradiation is decreased in the area of local defects and so local defects can be determined.