识别处理器中具有老化意识的代表性路径

2015 IEEE 21st International On-Line Testing Symposium (IOLTS) Pub Date : 2015-07-06 DOI:10.1109/IOLTS.2015.7229825

C. Sandionigi, O. Héron

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引用次数: 3

摘要

本文提出了一种在NBTI条件下选择一组代表处理器行为的路径的方法。所选择的路径是由于任何已执行的应用程序老化而预计首先失败的路径。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Identifying aging-aware representative paths in processors

This paper proposes a method to select a set of paths representative of the behavior of a processor under NBTI conditions. The selected paths are the ones that are expected to fail first due to aging for any executed application.

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来源期刊

2015 IEEE 21st International On-Line Testing Symposium (IOLTS)

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