使用时间分辨发射(TRE)探测器进行电路调试-一个案例研究

2006 IEEE International Conference on Semiconductor Electronics Pub Date : 2006-11-01 DOI:10.1109/SMELEC.2006.380711

Houn Wai Wong, P.F. Low, V.K. Wong

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引用次数: 0

摘要

时间分辨发射显微镜(TRE)是一种革命性的工具，用于先进的微处理器硅调试。与其他调试工具不同，TRE数据的解释可能并不直接，有时可能会产生误导。在本文中，我们通过一个案例研究来说明为什么这是正确的。在器件发射物理、电路行为和创造性故障分析知识的基础上，对TRE数据进行仔细的解释。

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Circuit Debug using Time Resolved Emission (TRE) Prober - A Case Study

Time resolved emission microscopy (TRE) is a revolutionary tool used in advanced microprocessors silicon debug. Unlike other debug tools, the interpretation of TRE data may not be straightforward and can sometimes be misleading. In this paper we show through a case study why this is true. Interpretation of TRE data should be done carefully with good knowledge on device emission physics, circuit behavior and creative fault analysis.

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2006 IEEE International Conference on Semiconductor Electronics

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