2006 IEEE International Conference on Semiconductor Electronics

Synchrotron Radiation X-ray Diffraction and X-ray Photoelectron Spectroscopy Investigation on Si-based Structures for Sub-Micron Si-IC Applications

Pub Date : 2006-12-01 DOI: 10.1109/SMELEC.2006.380785 Z. Feng, L. Cheng, Chu-Wan Huang, Ying-Lang Wang, T. Yang

Device Design Consideration for Nanoscale MOSFET Using Semiconductor TCAD Tools

Pub Date : 2006-12-01 DOI: 10.1109/SMELEC.2006.380770 T. C. Hong, R. Ismail

Comparison of Electronic Transport Parameter of CNT(10,10)/CNT(17,0) and CNT(5,5)/CNT(8,0) Carbon Nanotube Metal-Semiconductor On-Tube Heterojunction

Pub Date : 2006-11-01 DOI: 10.1109/SMELEC.2006.381062 Sukirno, S. Z. Bisri, Irmelia, L. Hasanah, A. B. Suryamas, I. Usman, Mursal