基于Anand模型的纳米银浆循环热模拟

Hui Yang, Z. Zhan
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引用次数: 1

摘要

由于低温烧结纳米银膏体的优点,纳米银可以在低温下烧结而在高温下工作,与其他无铅焊料相比,低温烧结纳米银膏体已经在各种芯片封装中得到了应用。本文采用Anand粘弹性本构模型,利用WORKBENCH软件对纳米银浆阵列芯片的热循环载荷进行模拟。仿真结果表明,经过4个热循环载荷循环后,焊点的温度分布由中心向周围逐渐升高,且边角焊点温度最高,因此最大的塑性应变积累发生在边角焊点。对于单个焊点,靠近基板的温度较高,因此焊点底部更容易发生变形和破坏,这是可能导致芯片连接失败的主要两个原因。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Cycle thermal simulation of nano silver paste based on Anand model
Since the advantages of low temperature sintering of nano-silver paste, nano silver can sintering at low temperature and work at high temperatures, compared with other lead-free solders, low temperature sintering of nano-silver paste has been applied in various chip packages. In this paper, Anand viscoelastic constitutive model was adopted, and WORKBENCH software was used to simulate the hot cycle load of the array chip of nano-silver paste. The simulation results show that the after four cycles of thermal cycle load, the temperature distribution of the solder joints gradually increases from the center to the surroundings, and the solder joints at the corners have the highest temperature, so the maximum plastic strain accumulation occurred at corner solder joints. For a single solder joint, the temperature near the substrate is higher, so deformation and destroy more prone occurred at the bottom of the solder joints, which is the main two reason that may cause the failure of chip connection.
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