硅深低温刻蚀中孔径形状影响的数值研究

M. Rudenko, A. Miakonkikh, V. Lukichev
{"title":"硅深低温刻蚀中孔径形状影响的数值研究","authors":"M. Rudenko, A. Miakonkikh, V. Lukichev","doi":"10.1117/12.2622908","DOIUrl":null,"url":null,"abstract":"Cryogenic etching of silicon in SF6/O2 plasma is the process of choice for fabrication of deep high aspect ratio structures with strict requirements for sidewall angle, surface roughness and contamination, including MEMS, X-ray optics, and supercapacitors. The manufacturing of such structures, containing features of various size and shape, poses new challenges for the etching process optimization, since the key parameters of the resulting structures depend on the local aspect ratio and the shape of the mask aperture. As an aid in process optimization, we propose a three-dimensional Monte-Carlo simulator for the cryogenic etching of complex structures. It employs a surface kinetics model tuned to SF6/O2 process in 2 1⁄2D geometry and cubic voxel representations of simulation domain. Systematic study on cryogenic etching of test structures of different mask shape and aspect ratio is performed and principal mechanisms affecting etching results are identified.","PeriodicalId":388511,"journal":{"name":"International Conference on Micro- and Nano-Electronics","volume":"4 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-01-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Numerical study of aperture shape effects in deep cryogenic etching of silicon\",\"authors\":\"M. Rudenko, A. Miakonkikh, V. Lukichev\",\"doi\":\"10.1117/12.2622908\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Cryogenic etching of silicon in SF6/O2 plasma is the process of choice for fabrication of deep high aspect ratio structures with strict requirements for sidewall angle, surface roughness and contamination, including MEMS, X-ray optics, and supercapacitors. The manufacturing of such structures, containing features of various size and shape, poses new challenges for the etching process optimization, since the key parameters of the resulting structures depend on the local aspect ratio and the shape of the mask aperture. As an aid in process optimization, we propose a three-dimensional Monte-Carlo simulator for the cryogenic etching of complex structures. It employs a surface kinetics model tuned to SF6/O2 process in 2 1⁄2D geometry and cubic voxel representations of simulation domain. Systematic study on cryogenic etching of test structures of different mask shape and aspect ratio is performed and principal mechanisms affecting etching results are identified.\",\"PeriodicalId\":388511,\"journal\":{\"name\":\"International Conference on Micro- and Nano-Electronics\",\"volume\":\"4 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2022-01-30\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"International Conference on Micro- and Nano-Electronics\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1117/12.2622908\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"International Conference on Micro- and Nano-Electronics","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1117/12.2622908","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

在SF6/O2等离子体中低温刻蚀硅是制造深度高纵横比结构的首选工艺,对侧壁角,表面粗糙度和污染有严格要求,包括MEMS, x射线光学和超级电容器。这种结构的制造包含各种尺寸和形状的特征,这对蚀刻工艺优化提出了新的挑战,因为所得到的结构的关键参数取决于局部宽高比和掩膜孔径的形状。为了帮助工艺优化,我们提出了一个用于复杂结构低温刻蚀的三维蒙特卡罗模拟器。它采用了一个表面动力学模型,调整为SF6/O2过程在2 1 / 2D几何和模拟域的立方体素表示。对不同掩模形状和宽高比的测试结构进行了系统的低温刻蚀研究,确定了影响刻蚀效果的主要机理。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Numerical study of aperture shape effects in deep cryogenic etching of silicon
Cryogenic etching of silicon in SF6/O2 plasma is the process of choice for fabrication of deep high aspect ratio structures with strict requirements for sidewall angle, surface roughness and contamination, including MEMS, X-ray optics, and supercapacitors. The manufacturing of such structures, containing features of various size and shape, poses new challenges for the etching process optimization, since the key parameters of the resulting structures depend on the local aspect ratio and the shape of the mask aperture. As an aid in process optimization, we propose a three-dimensional Monte-Carlo simulator for the cryogenic etching of complex structures. It employs a surface kinetics model tuned to SF6/O2 process in 2 1⁄2D geometry and cubic voxel representations of simulation domain. Systematic study on cryogenic etching of test structures of different mask shape and aspect ratio is performed and principal mechanisms affecting etching results are identified.
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