M. Cimino, H. Lapuyade, M. De matos, T. Taris, Y. Deval, J. Bégueret
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引用次数: 5
摘要
提出了一种采用0.13 μ m CMOS工艺设计的具有自检和高可靠性的低噪声放大器。这种LNA可用于无线局域网关键节点前端的设计，以保证数据的传输。LNA的测试基于内置的自我测试方法，该方法允许监控其行为，并且通过使用冗余确保其可靠性。LNA工作在0.9 V电源电压下，测试芯片具有适合802.11 b/g应用的特性。参数故障的注入和检测证明了BIST电路的有效性。在每个冗余块上的切换已经证明LNA保持了它的性能。
A Sub 1V CMOS LNA dedicated to 802.11b/g applications with self-test & high reliability capabilities
A low noise amplifier designed in a 0.13 mum CMOS technology, which has self-test and high reliability capabilities, is presented. Such a LNA could be used in the design of front-end of critical nodes in wireless local area networks to ensure the data transmission. The test of the LNA is based on a built-in self test methodology that permits to monitor its behavior and its reliability is ensured by the use of redundancies. The LNA works under a 0.9 V supply voltage and the test chip has characteristics suitable for 802.11 b/g applications. Parametric faults are injected and detected that demonstrate the efficiency of the BIST circuitry. Switching on each redundant block has proven that the LNA keeps its performances.
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