HEIST:一种硬件信号故障注入方法,支持可行的软件稳健性测试

Martin Skriver, A. S. Sørensen, U. Schultz
{"title":"HEIST:一种硬件信号故障注入方法,支持可行的软件稳健性测试","authors":"Martin Skriver, A. S. Sørensen, U. Schultz","doi":"10.1109/DDECS52668.2021.9417053","DOIUrl":null,"url":null,"abstract":"In this paper we investigate the use of FPGAs to inject faults into data streams as a supplement to the international EMC-test standards. We aim to test the robustness and reliability of software based measures against the effects of electromagnetic interference. The proposed methodology, HEIST, uses high-speed acquisition of faulty data and high-speed fault injection. HEIST requires less insight into electromagnetism and electronics compared to other iterative EMC qualification processes. This is particularly relevant in designs where a strategy of 100% hardware-based noise avoidance is not feasible, and software based noise handling has been implemented as a supplement. Such situations are typical in mobile light-weight systems such as drones, where shielding and hardware filters add undesirable weight. The methodology is verified by comparing data from a serial communication link that has been exposed to burst noise based on the IEC 61000-4-4 test standard with data from the same setup, but replacing the burst generator with the HEIST approach. The result shows an excellent correlation indicating that HEIST can replace the burst generator for a software EMC test in an ongoing software development process.","PeriodicalId":415808,"journal":{"name":"2021 24th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS)","volume":"38 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2021-04-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"HEIST: A Hardware Signal Fault Injection Methodology Enabling Feasible Software Robustness Testing\",\"authors\":\"Martin Skriver, A. S. Sørensen, U. Schultz\",\"doi\":\"10.1109/DDECS52668.2021.9417053\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper we investigate the use of FPGAs to inject faults into data streams as a supplement to the international EMC-test standards. We aim to test the robustness and reliability of software based measures against the effects of electromagnetic interference. The proposed methodology, HEIST, uses high-speed acquisition of faulty data and high-speed fault injection. HEIST requires less insight into electromagnetism and electronics compared to other iterative EMC qualification processes. This is particularly relevant in designs where a strategy of 100% hardware-based noise avoidance is not feasible, and software based noise handling has been implemented as a supplement. Such situations are typical in mobile light-weight systems such as drones, where shielding and hardware filters add undesirable weight. The methodology is verified by comparing data from a serial communication link that has been exposed to burst noise based on the IEC 61000-4-4 test standard with data from the same setup, but replacing the burst generator with the HEIST approach. The result shows an excellent correlation indicating that HEIST can replace the burst generator for a software EMC test in an ongoing software development process.\",\"PeriodicalId\":415808,\"journal\":{\"name\":\"2021 24th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS)\",\"volume\":\"38 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2021-04-07\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2021 24th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/DDECS52668.2021.9417053\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2021 24th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DDECS52668.2021.9417053","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

在本文中,我们研究了使用fpga将故障注入到数据流中,作为对国际emc测试标准的补充。我们的目的是测试基于软件的措施对电磁干扰的鲁棒性和可靠性。提出的方法HEIST采用高速采集故障数据和高速故障注入。与其他迭代EMC认证过程相比,HEIST对电磁学和电子学的了解较少。这在100%基于硬件的噪音避免策略不可行的设计中尤其重要,而基于软件的噪音处理已被实施作为补充。这种情况在无人机等移动轻型系统中很常见,其中屏蔽和硬件过滤器增加了不必要的重量。通过比较基于IEC 61000-4-4测试标准的暴露于突发噪声的串行通信链路的数据与来自相同设置的数据,但用HEIST方法替换突发发生器,验证了该方法。结果显示出良好的相关性,表明在正在进行的软件开发过程中,HEIST可以取代突发发生器进行软件EMC测试。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
HEIST: A Hardware Signal Fault Injection Methodology Enabling Feasible Software Robustness Testing
In this paper we investigate the use of FPGAs to inject faults into data streams as a supplement to the international EMC-test standards. We aim to test the robustness and reliability of software based measures against the effects of electromagnetic interference. The proposed methodology, HEIST, uses high-speed acquisition of faulty data and high-speed fault injection. HEIST requires less insight into electromagnetism and electronics compared to other iterative EMC qualification processes. This is particularly relevant in designs where a strategy of 100% hardware-based noise avoidance is not feasible, and software based noise handling has been implemented as a supplement. Such situations are typical in mobile light-weight systems such as drones, where shielding and hardware filters add undesirable weight. The methodology is verified by comparing data from a serial communication link that has been exposed to burst noise based on the IEC 61000-4-4 test standard with data from the same setup, but replacing the burst generator with the HEIST approach. The result shows an excellent correlation indicating that HEIST can replace the burst generator for a software EMC test in an ongoing software development process.
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