{"title":"片上RLC布线中基于传输线的简化串扰噪声模型","authors":"K. Agarwal, D. Sylvester, D. Blaauw","doi":"10.1109/ASPDAC.2004.1337715","DOIUrl":null,"url":null,"abstract":"In this paper, we prerent B new RLC emstalk noise model Ihat combines simplicity, accuracy, and generality. The new model b based on transmission line theory and is applicable to asymmetric driver and line conliguratiions. The results show that the model captures both Ihe waveform shape and peak noise accurately (average emr in peak noise was 6.5%). A key feature of the new model is Ihat its derivation and form enables physical insight into Ihe dependency of total coupling noise on Itlevant physical design paramten. The model is applied to investigate Ihe impact of various physical design optimizations (e.g., wire sizing and sparing, shield insertion) on total RLC coupled noise. Results indicate that wmmon (capacitive) noise avoidance techniques can behave quite dilTerenUy when baIh capacitive and inductive coupling are convidered together.","PeriodicalId":426349,"journal":{"name":"ASP-DAC 2004: Asia and South Pacific Design Automation Conference 2004 (IEEE Cat. No.04EX753)","volume":"230 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2004-01-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"15","resultStr":"{\"title\":\"A simplifiediyansmission-line based crosstalk noise model for on-chip RLC wiring\",\"authors\":\"K. Agarwal, D. Sylvester, D. Blaauw\",\"doi\":\"10.1109/ASPDAC.2004.1337715\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper, we prerent B new RLC emstalk noise model Ihat combines simplicity, accuracy, and generality. The new model b based on transmission line theory and is applicable to asymmetric driver and line conliguratiions. The results show that the model captures both Ihe waveform shape and peak noise accurately (average emr in peak noise was 6.5%). A key feature of the new model is Ihat its derivation and form enables physical insight into Ihe dependency of total coupling noise on Itlevant physical design paramten. The model is applied to investigate Ihe impact of various physical design optimizations (e.g., wire sizing and sparing, shield insertion) on total RLC coupled noise. Results indicate that wmmon (capacitive) noise avoidance techniques can behave quite dilTerenUy when baIh capacitive and inductive coupling are convidered together.\",\"PeriodicalId\":426349,\"journal\":{\"name\":\"ASP-DAC 2004: Asia and South Pacific Design Automation Conference 2004 (IEEE Cat. No.04EX753)\",\"volume\":\"230 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2004-01-27\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"15\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"ASP-DAC 2004: Asia and South Pacific Design Automation Conference 2004 (IEEE Cat. No.04EX753)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ASPDAC.2004.1337715\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"ASP-DAC 2004: Asia and South Pacific Design Automation Conference 2004 (IEEE Cat. No.04EX753)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ASPDAC.2004.1337715","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A simplifiediyansmission-line based crosstalk noise model for on-chip RLC wiring
In this paper, we prerent B new RLC emstalk noise model Ihat combines simplicity, accuracy, and generality. The new model b based on transmission line theory and is applicable to asymmetric driver and line conliguratiions. The results show that the model captures both Ihe waveform shape and peak noise accurately (average emr in peak noise was 6.5%). A key feature of the new model is Ihat its derivation and form enables physical insight into Ihe dependency of total coupling noise on Itlevant physical design paramten. The model is applied to investigate Ihe impact of various physical design optimizations (e.g., wire sizing and sparing, shield insertion) on total RLC coupled noise. Results indicate that wmmon (capacitive) noise avoidance techniques can behave quite dilTerenUy when baIh capacitive and inductive coupling are convidered together.