多层封装倒装ic的设计问题

R. Frye
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引用次数: 0

摘要

最初为MCM开发的倒装片区域阵列附件可减小IC尺寸并提高操作速度,特别是用于具有大量I/O的高端asic。它也被证明非常适合在单芯片BGA封装中使用。然而,对于大多数对该技术经验有限的设计师来说,一个关键问题是缺乏被广泛接受的设计方法。本文探讨了倒装芯片结构的优点,讨论了新兴的物理设计方法,并指出了倒装芯片ASIC设计中存在的一些挑战。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Design issues for flip-chip ICs in multilayer packages
Flip-chip area array attachment, originally developed for MCM offers IC size reduction and improved operating speed, especially for high-end ASICs with large numbers of I/O. It is also proving to be well-suited for use in single-chip BGA packages. A key problem for most designers having limited experience with the technology, however, is the lack of a widely accepted design methodology. This paper examines the advantages of the flip-chip structure discusses emerging physical design methodologies and points out some of the remaining challenges in flip-chip ASIC design.
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