{"title":"半导体功率器件多尺度热-机械有限元分析中的不一致网格","authors":"S. Eiser, M. Kaltenbacher, M. Nelhiebel","doi":"10.1109/EUROSIME.2013.6529946","DOIUrl":null,"url":null,"abstract":"A thermo-mechanical investigation of a Smart Power Switch using the Finite Element Method is presented. We consider a non-conforming discretization of the computational domain to bridge the scales. It allows a high degree of flexibility for discretizing the region where a fine mesh is required. We benchmark a simplified, Lagrange multiplier based displacement method in terms of accuracy and runtime. Compared to the widespread submodeling technique, it eliminates the need for elaborate homogenization methods. Results are shown for two and three-dimensional problems.","PeriodicalId":270532,"journal":{"name":"2013 14th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2013-04-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"9","resultStr":"{\"title\":\"Non-conforming meshes in multi-scale thermo-mechanical Finite Element Analysis of semiconductor power devices\",\"authors\":\"S. Eiser, M. Kaltenbacher, M. Nelhiebel\",\"doi\":\"10.1109/EUROSIME.2013.6529946\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A thermo-mechanical investigation of a Smart Power Switch using the Finite Element Method is presented. We consider a non-conforming discretization of the computational domain to bridge the scales. It allows a high degree of flexibility for discretizing the region where a fine mesh is required. We benchmark a simplified, Lagrange multiplier based displacement method in terms of accuracy and runtime. Compared to the widespread submodeling technique, it eliminates the need for elaborate homogenization methods. Results are shown for two and three-dimensional problems.\",\"PeriodicalId\":270532,\"journal\":{\"name\":\"2013 14th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE)\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2013-04-14\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"9\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2013 14th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EUROSIME.2013.6529946\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2013 14th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EUROSIME.2013.6529946","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Non-conforming meshes in multi-scale thermo-mechanical Finite Element Analysis of semiconductor power devices
A thermo-mechanical investigation of a Smart Power Switch using the Finite Element Method is presented. We consider a non-conforming discretization of the computational domain to bridge the scales. It allows a high degree of flexibility for discretizing the region where a fine mesh is required. We benchmark a simplified, Lagrange multiplier based displacement method in terms of accuracy and runtime. Compared to the widespread submodeling technique, it eliminates the need for elaborate homogenization methods. Results are shown for two and three-dimensional problems.