{"title":"TILMICRO,一个新的SEU和锁存器测试微处理器:对32位浮点dsp的初步结果","authors":"F. Bezerra, D. Hardy, R. Velazco, H. Ziade","doi":"10.1109/RADECS.1995.509793","DOIUrl":null,"url":null,"abstract":"As the need for 32 bit DSPs increases for on board equipment, we have built a new SEU and latch-up tester that is able to test processors such as these DSPs. The first results have been obtained on the 96002 from Motorola and the ADSP21020 from Analog Devices.","PeriodicalId":310087,"journal":{"name":"Proceedings of the Third European Conference on Radiation and its Effects on Components and Systems","volume":"2 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1995-09-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"9","resultStr":"{\"title\":\"TILMICRO, a new SEU and latch-up tester for microprocessors: initial results on 32-bit floating point DSPs\",\"authors\":\"F. Bezerra, D. Hardy, R. Velazco, H. Ziade\",\"doi\":\"10.1109/RADECS.1995.509793\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"As the need for 32 bit DSPs increases for on board equipment, we have built a new SEU and latch-up tester that is able to test processors such as these DSPs. The first results have been obtained on the 96002 from Motorola and the ADSP21020 from Analog Devices.\",\"PeriodicalId\":310087,\"journal\":{\"name\":\"Proceedings of the Third European Conference on Radiation and its Effects on Components and Systems\",\"volume\":\"2 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1995-09-18\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"9\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the Third European Conference on Radiation and its Effects on Components and Systems\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/RADECS.1995.509793\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the Third European Conference on Radiation and its Effects on Components and Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/RADECS.1995.509793","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
TILMICRO, a new SEU and latch-up tester for microprocessors: initial results on 32-bit floating point DSPs
As the need for 32 bit DSPs increases for on board equipment, we have built a new SEU and latch-up tester that is able to test processors such as these DSPs. The first results have been obtained on the 96002 from Motorola and the ADSP21020 from Analog Devices.