用于荧光寿命应用的单光子雪崩二极管成像仪

2007 IEEE Symposium on VLSI Circuits Pub Date : 2007-06-14 DOI:10.1109/VLSIC.2007.4342691

D. E. Schwartz, E. Charbon, Kenneth L. Shepard

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引用次数: 13

摘要

用于时间分辨荧光检测的64 × 64像素CMOS单光子雪崩二极管(SPAD)成像仪具有主动淬灭和复位像素，允许门控检测消除大多数时间相关单光子计数(TCSPC)方法常见的堆积非线性。时序信息的收集使用基于计数器和电源调节延迟锁环(DLL)的片上时间-数字转换器(TDC)。

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A Single-Photon Avalanche Diode Imager for Fluorescence Lifetime Applications

A 64-by-64-pixel CMOS single-photon avalanche diode (SPAD) imager for time-resolved fluorescence detection features actively quenched and reset pixels, allowing gated detection to eliminate pile-up nonlinearities common to most time-correlated single-photon counting (TCSPC) approaches. Timing information is collected using an on-chip time-to-digital converter (TDC) based on a counter and a supply-regulated delay-locked loop (DLL).

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来源期刊

2007 IEEE Symposium on VLSI Circuits

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