带转换数据保护的多模数字像素的设计

IF 1 4区 工程技术 Q4 ENGINEERING, ELECTRICAL & ELECTRONIC
Yan-Hua Ma, Xiang-He Kong, Yu-Chun Chang
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引用次数: 0

摘要

随着半导体技术的发展,数字像素受到了广泛的关注,并应用于各种电子产品中。然而,由于面积的限制,设计具有多种模式的数字像素是一项具有挑战性的任务。本文提出了一种基于脉冲宽度调制的数字像素,可兼容五种不同的模式。通过使用多用途电容和静态随机存取存储器结构,可以在与单模数字像素相当的面积内实现多模转换,而不会降低性能。在此基础上,提出了相应的逻辑控制方法,保证了模式转换过程中帧数据的完整性。本文提出的数字像素在Tower Jazz 0.18 μm工艺中的仿真结果表明,在明亮场中,它的动态范围达到67 dB。在暗场中,经过相关双采样后的转换增益可达13.91 μV/e−,输入噪声为37.89 e−/像素。
本文章由计算机程序翻译,如有差异,请以英文原文为准。

Design of a multi-mode digital pixel with conversion data protection

Design of a multi-mode digital pixel with conversion data protection

With the development of semiconductor technology, digital pixel has received widespread attention and is applied to various electronic products. However, due to the limitation of area, it forms a challenging task to design a digital pixel with multiple modes. In this paper, a pulse width modulation based digital pixel is proposed, which is compatible with five different modes. By using the multi-purpose capacitors and static random access memory structure, it can realise multi-mode conversion in an equivalent area to that of the single mode digital pixel without performance degradation. Furthermore, a corresponding logic control method is developed, such that the integrity of the frame data is ensured during mode conversion. The simulation result of our proposed digital pixel in Tower Jazz 0.18 μm process shows that in the bright field it achieves a dynamic range of 67 dB. In the dark field, it achieves a conversion gain up to 13.91 μV/e−, with input noise of 37.89 e−per pixel after correlated double sampling.

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来源期刊
Iet Circuits Devices & Systems
Iet Circuits Devices & Systems 工程技术-工程:电子与电气
CiteScore
3.80
自引率
7.70%
发文量
32
审稿时长
3 months
期刊介绍: IET Circuits, Devices & Systems covers the following topics: Circuit theory and design, circuit analysis and simulation, computer aided design Filters (analogue and switched capacitor) Circuit implementations, cells and architectures for integration including VLSI Testability, fault tolerant design, minimisation of circuits and CAD for VLSI Novel or improved electronic devices for both traditional and emerging technologies including nanoelectronics and MEMs Device and process characterisation, device parameter extraction schemes Mathematics of circuits and systems theory Test and measurement techniques involving electronic circuits, circuits for industrial applications, sensors and transducers
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