{"title":"小批量专用集成电路的质量和可靠性监控","authors":"D. Alexander, S. Philpy, D. Pierce","doi":"10.1109/IRPS.2009.5173257","DOIUrl":null,"url":null,"abstract":"The authors present a discussion of the issues and an approach for qualification and reliability monitoring for small quantity ASICs used in long lifetime applications. Special attention is given to issues associated with sub-100 nm technologies and the unique challenges posed by new materials and processes.","PeriodicalId":345860,"journal":{"name":"2009 IEEE International Reliability Physics Symposium","volume":"10 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2009-04-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Qualification & reliability monitoring for small quantity ASIC populations\",\"authors\":\"D. Alexander, S. Philpy, D. Pierce\",\"doi\":\"10.1109/IRPS.2009.5173257\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The authors present a discussion of the issues and an approach for qualification and reliability monitoring for small quantity ASICs used in long lifetime applications. Special attention is given to issues associated with sub-100 nm technologies and the unique challenges posed by new materials and processes.\",\"PeriodicalId\":345860,\"journal\":{\"name\":\"2009 IEEE International Reliability Physics Symposium\",\"volume\":\"10 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2009-04-26\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2009 IEEE International Reliability Physics Symposium\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IRPS.2009.5173257\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 IEEE International Reliability Physics Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IRPS.2009.5173257","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Qualification & reliability monitoring for small quantity ASIC populations
The authors present a discussion of the issues and an approach for qualification and reliability monitoring for small quantity ASICs used in long lifetime applications. Special attention is given to issues associated with sub-100 nm technologies and the unique challenges posed by new materials and processes.
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