一个沟槽隔离厚SOI工艺作为平台的各种电气和光学集成器件

R. Lerner, D. Gaebler, K. Schottmann, S. Hering
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引用次数: 2

摘要

将各种新的光学和高压器件集成到现有的沟槽隔离650 V BCD工艺中,并在厚SOI晶圆上进行最小的额外处理工作。沟槽隔离以及SOI晶圆的厚度允许构建隔离的光电二极管,即使对红色和红外波长也具有出色的响应。此外,厚SOI材料可以集成垂直高压器件,如NPN双极晶体管。与特殊的集电极设计一起,SOI拓扑允许集成IGBT器件,这些器件可以通过设计措施仅在导通状态和开关性能之间进行调整。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A trench isolated thick SOI process as platform for various electrical and optical integrated devices
The integration of various new optical and high voltage devices into an existing trench isolated 650 V BCD process on thick SOI wafers with a minimum of additional processing effort is reported. The trench isolation together with the thickness of the SOI wafer allows the construction of isolated photodiodes with excellent response even for red and infrared wavelengths. Furthermore the thick SOI material enables the integration of vertical high voltage devices like NPN bipolar transistors. Together with a special collector design the SOI topology allows the integration of IGBT devices which can be tuned by design measures only between on-state and switching performance.
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