Tang Diyin, Jinsong Yu, Chen Xiongzi, Wang Honglun
{"title":"开发开放式体系结构测试系统","authors":"Tang Diyin, Jinsong Yu, Chen Xiongzi, Wang Honglun","doi":"10.1109/ICEMI.2011.6037763","DOIUrl":null,"url":null,"abstract":"Next generation test system tends to be more dependent on open architecture, in order to address reusability and interoperability of test solutions. This paper provides a framework of open-architecture test systems, not only realizing the fundamental modularization and integration in a general open-architecture, but also reinforcing the interchangeability of TPS & instruments, as well as parallel development of test software by ATE software technologies. Basic structure, realization details, and a case study are presented in this paper to demonstrate its feasibility and prospective for a wide range of applications.","PeriodicalId":321964,"journal":{"name":"IEEE 2011 10th International Conference on Electronic Measurement & Instruments","volume":"2 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2011-10-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Development of open architecture test systems\",\"authors\":\"Tang Diyin, Jinsong Yu, Chen Xiongzi, Wang Honglun\",\"doi\":\"10.1109/ICEMI.2011.6037763\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Next generation test system tends to be more dependent on open architecture, in order to address reusability and interoperability of test solutions. This paper provides a framework of open-architecture test systems, not only realizing the fundamental modularization and integration in a general open-architecture, but also reinforcing the interchangeability of TPS & instruments, as well as parallel development of test software by ATE software technologies. Basic structure, realization details, and a case study are presented in this paper to demonstrate its feasibility and prospective for a wide range of applications.\",\"PeriodicalId\":321964,\"journal\":{\"name\":\"IEEE 2011 10th International Conference on Electronic Measurement & Instruments\",\"volume\":\"2 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2011-10-10\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE 2011 10th International Conference on Electronic Measurement & Instruments\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICEMI.2011.6037763\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE 2011 10th International Conference on Electronic Measurement & Instruments","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICEMI.2011.6037763","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Next generation test system tends to be more dependent on open architecture, in order to address reusability and interoperability of test solutions. This paper provides a framework of open-architecture test systems, not only realizing the fundamental modularization and integration in a general open-architecture, but also reinforcing the interchangeability of TPS & instruments, as well as parallel development of test software by ATE software technologies. Basic structure, realization details, and a case study are presented in this paper to demonstrate its feasibility and prospective for a wide range of applications.