M. Gaffar, M. Alam, Sayed Ashraf Mamun, M. Zaman, A. Bhuiya
{"title":"一种模拟栅极环纳米线晶体管通道电位的新方法","authors":"M. Gaffar, M. Alam, Sayed Ashraf Mamun, M. Zaman, A. Bhuiya","doi":"10.1109/TENCON.2010.5686447","DOIUrl":null,"url":null,"abstract":"A compact, physical surface potential model for undoped Gate All Around (GAA) MOSFETs has been derived based on a novel analytical solution of the 3-D Poisson equation with the mobile charge term included. The new model is verified by published numerical simulator, Silvaco Device simulator Atlas with close agreement. Applying the newly developed model, the channel potential versus gate voltage characteristics for the devices having equal body diameter but different thickness pass through a single common point (termed as “crossover point”). A comparative study of between analytical and numerical solutions has been presented.","PeriodicalId":101683,"journal":{"name":"TENCON 2010 - 2010 IEEE Region 10 Conference","volume":"27 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"A novel approach of modeling channel potential for Gate All Around nanowire transistor\",\"authors\":\"M. Gaffar, M. Alam, Sayed Ashraf Mamun, M. Zaman, A. Bhuiya\",\"doi\":\"10.1109/TENCON.2010.5686447\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A compact, physical surface potential model for undoped Gate All Around (GAA) MOSFETs has been derived based on a novel analytical solution of the 3-D Poisson equation with the mobile charge term included. The new model is verified by published numerical simulator, Silvaco Device simulator Atlas with close agreement. Applying the newly developed model, the channel potential versus gate voltage characteristics for the devices having equal body diameter but different thickness pass through a single common point (termed as “crossover point”). A comparative study of between analytical and numerical solutions has been presented.\",\"PeriodicalId\":101683,\"journal\":{\"name\":\"TENCON 2010 - 2010 IEEE Region 10 Conference\",\"volume\":\"27 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2010-11-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"TENCON 2010 - 2010 IEEE Region 10 Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/TENCON.2010.5686447\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"TENCON 2010 - 2010 IEEE Region 10 Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TENCON.2010.5686447","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A novel approach of modeling channel potential for Gate All Around nanowire transistor
A compact, physical surface potential model for undoped Gate All Around (GAA) MOSFETs has been derived based on a novel analytical solution of the 3-D Poisson equation with the mobile charge term included. The new model is verified by published numerical simulator, Silvaco Device simulator Atlas with close agreement. Applying the newly developed model, the channel potential versus gate voltage characteristics for the devices having equal body diameter but different thickness pass through a single common point (termed as “crossover point”). A comparative study of between analytical and numerical solutions has been presented.