ARM Cortex-A9双核串行和并行应用的软误差分析

2016 17th Latin-American Test Symposium (LATS) Pub Date : 2016-04-06 DOI:10.1109/LATW.2016.7483359

G. Rodrigues, F. Kastensmidt

{"title":"ARM Cortex-A9双核串行和并行应用的软误差分析","authors":"G. Rodrigues, F. Kastensmidt","doi":"10.1109/LATW.2016.7483359","DOIUrl":null,"url":null,"abstract":"This work presents an analysis of the occurrence of software errors at ARM Cortex-A9 dual-core processor. Fault injection results compare the error rate and their causes. Results show that different parallelization algorithms can have different error rates, and that there is a tendency on parallel applications to have more silent data corruption errors than their sequential counterparts.","PeriodicalId":135851,"journal":{"name":"2016 17th Latin-American Test Symposium (LATS)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-04-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":"{\"title\":\"Soft error analysis at sequential and parallel applications in ARM Cortex-A9 dual-core\",\"authors\":\"G. Rodrigues, F. Kastensmidt\",\"doi\":\"10.1109/LATW.2016.7483359\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This work presents an analysis of the occurrence of software errors at ARM Cortex-A9 dual-core processor. Fault injection results compare the error rate and their causes. Results show that different parallelization algorithms can have different error rates, and that there is a tendency on parallel applications to have more silent data corruption errors than their sequential counterparts.\",\"PeriodicalId\":135851,\"journal\":{\"name\":\"2016 17th Latin-American Test Symposium (LATS)\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2016-04-06\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"7\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2016 17th Latin-American Test Symposium (LATS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/LATW.2016.7483359\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 17th Latin-American Test Symposium (LATS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/LATW.2016.7483359","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 7

摘要

本文分析了ARM Cortex-A9双核处理器软件错误的发生。错误注入结果比较了错误率及其原因。结果表明，不同的并行化算法可能有不同的错误率，并且在并行应用程序上有一种趋势，即比顺序应用程序有更多的无声数据损坏错误。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

查看原文本刊更多论文

Soft error analysis at sequential and parallel applications in ARM Cortex-A9 dual-core

This work presents an analysis of the occurrence of software errors at ARM Cortex-A9 dual-core processor. Fault injection results compare the error rate and their causes. Results show that different parallelization algorithms can have different error rates, and that there is a tendency on parallel applications to have more silent data corruption errors than their sequential counterparts.

求助全文

通过发布文献求助，成功后即可免费获取论文全文。去求助

来源期刊

2016 17th Latin-American Test Symposium (LATS)

自引率

0.00%

发文量