{"title":"一种采用硅通孔的用于堆叠式事务性芯片多处理器的三维片上网络","authors":"Sumeet S. Kumar, R. van Leuken","doi":"10.1109/DTIS.2011.5941443","DOIUrl":null,"url":null,"abstract":"Effective utilization of computing power offered by modern chip multiprocessors (CMP) depends on the design and performance of the interconnect that connects them. We present a three-dimensional Network-on-Chip (NoC) based on the R3 router architecture for transactional CMPs utilizing advanced Through Silicon Vias (TSV) in a stacked-die architecture, facilitating low latency and high throughput communication between CMP nodes. We report the performance of an R3 based three-dimensional mesh in a stacked-die transactional CMP highlighting the limitations of performance scale-up with stacking. Furthermore, we present data on area penalty associated with the use of TSVs in different configurations in 90nm UMC technology.","PeriodicalId":409387,"journal":{"name":"2011 6th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS)","volume":"39 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2011-04-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"16","resultStr":"{\"title\":\"A 3D Network-on-Chip for stacked-die transactional chip multiprocessors using Through Silicon Vias\",\"authors\":\"Sumeet S. Kumar, R. van Leuken\",\"doi\":\"10.1109/DTIS.2011.5941443\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Effective utilization of computing power offered by modern chip multiprocessors (CMP) depends on the design and performance of the interconnect that connects them. We present a three-dimensional Network-on-Chip (NoC) based on the R3 router architecture for transactional CMPs utilizing advanced Through Silicon Vias (TSV) in a stacked-die architecture, facilitating low latency and high throughput communication between CMP nodes. We report the performance of an R3 based three-dimensional mesh in a stacked-die transactional CMP highlighting the limitations of performance scale-up with stacking. Furthermore, we present data on area penalty associated with the use of TSVs in different configurations in 90nm UMC technology.\",\"PeriodicalId\":409387,\"journal\":{\"name\":\"2011 6th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS)\",\"volume\":\"39 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2011-04-06\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"16\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2011 6th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/DTIS.2011.5941443\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2011 6th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DTIS.2011.5941443","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A 3D Network-on-Chip for stacked-die transactional chip multiprocessors using Through Silicon Vias
Effective utilization of computing power offered by modern chip multiprocessors (CMP) depends on the design and performance of the interconnect that connects them. We present a three-dimensional Network-on-Chip (NoC) based on the R3 router architecture for transactional CMPs utilizing advanced Through Silicon Vias (TSV) in a stacked-die architecture, facilitating low latency and high throughput communication between CMP nodes. We report the performance of an R3 based three-dimensional mesh in a stacked-die transactional CMP highlighting the limitations of performance scale-up with stacking. Furthermore, we present data on area penalty associated with the use of TSVs in different configurations in 90nm UMC technology.