{"title":"内置模拟功能测试中的相位延迟测量与校准","authors":"J. Qin, Charles E. Stroud, Foster Dai","doi":"10.1109/SSST.2007.352336","DOIUrl":null,"url":null,"abstract":"A built-in self-test (BIST) approach has been proposed for functionality measurements of analog circuitry in mixed-signal systems. The BIST circuitry consists of a direct digital synthesizer (DDS) based test pattern generator (TPG) and multiplier/accumulator (MAC) based output response analyzer (ORA). In this paper we investigate and discuss the effects of phase delay on analog functionality measurements in mixed-signal systems when using MAC-based ORAs. We show that phase delay has a critical impact on measurement results and that the MAC-based ORA is an effective method for measuring phase delay.","PeriodicalId":330382,"journal":{"name":"2007 Thirty-Ninth Southeastern Symposium on System Theory","volume":"22 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2007-03-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"9","resultStr":"{\"title\":\"Phase Delay Measurement and Calibration in Built-In Analog Functional Testing\",\"authors\":\"J. Qin, Charles E. Stroud, Foster Dai\",\"doi\":\"10.1109/SSST.2007.352336\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A built-in self-test (BIST) approach has been proposed for functionality measurements of analog circuitry in mixed-signal systems. The BIST circuitry consists of a direct digital synthesizer (DDS) based test pattern generator (TPG) and multiplier/accumulator (MAC) based output response analyzer (ORA). In this paper we investigate and discuss the effects of phase delay on analog functionality measurements in mixed-signal systems when using MAC-based ORAs. We show that phase delay has a critical impact on measurement results and that the MAC-based ORA is an effective method for measuring phase delay.\",\"PeriodicalId\":330382,\"journal\":{\"name\":\"2007 Thirty-Ninth Southeastern Symposium on System Theory\",\"volume\":\"22 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2007-03-04\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"9\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2007 Thirty-Ninth Southeastern Symposium on System Theory\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/SSST.2007.352336\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2007 Thirty-Ninth Southeastern Symposium on System Theory","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SSST.2007.352336","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Phase Delay Measurement and Calibration in Built-In Analog Functional Testing
A built-in self-test (BIST) approach has been proposed for functionality measurements of analog circuitry in mixed-signal systems. The BIST circuitry consists of a direct digital synthesizer (DDS) based test pattern generator (TPG) and multiplier/accumulator (MAC) based output response analyzer (ORA). In this paper we investigate and discuss the effects of phase delay on analog functionality measurements in mixed-signal systems when using MAC-based ORAs. We show that phase delay has a critical impact on measurement results and that the MAC-based ORA is an effective method for measuring phase delay.
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