片上谐振电源降噪的去耦电容增强

14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems Pub Date : 2011-04-13 DOI:10.1109/DDECS.2011.5783058

Jinmyoung Kim, T. Nakura, H. Takata, K. Ishibashi, M. Ikeda, K. Asada

{"title":"片上谐振电源降噪的去耦电容增强","authors":"Jinmyoung Kim, T. Nakura, H. Takata, K. Ishibashi, M. Ikeda, K. Asada","doi":"10.1109/DDECS.2011.5783058","DOIUrl":null,"url":null,"abstract":"This paper presents a decoupling capacitance boosting method for on-chip resonant supply noise reduction for DVS systems. The switching controls of decoupling capacitors depending on the supply noise states achieve an effective noise reduction and fast settling time simultaneously compared with the conventional passive decoupling capacitors. The measurement results of a test chip fabricated in a 0.18µm CMOS technology show 12X boost of effective decap value, and 65.8% supply noise reduction with 96% settling time improvement.","PeriodicalId":231389,"journal":{"name":"14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2011-04-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Decoupling capacitance boosting for on-chip resonant supply noise reduction\",\"authors\":\"Jinmyoung Kim, T. Nakura, H. Takata, K. Ishibashi, M. Ikeda, K. Asada\",\"doi\":\"10.1109/DDECS.2011.5783058\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents a decoupling capacitance boosting method for on-chip resonant supply noise reduction for DVS systems. The switching controls of decoupling capacitors depending on the supply noise states achieve an effective noise reduction and fast settling time simultaneously compared with the conventional passive decoupling capacitors. The measurement results of a test chip fabricated in a 0.18µm CMOS technology show 12X boost of effective decap value, and 65.8% supply noise reduction with 96% settling time improvement.\",\"PeriodicalId\":231389,\"journal\":{\"name\":\"14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2011-04-13\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/DDECS.2011.5783058\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DDECS.2011.5783058","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 1

摘要

提出了一种用于分布式交换机系统片上谐振电源降噪的去耦电容增强方法。与传统的无源去耦电容相比，根据电源噪声状态对去耦电容进行开关控制，实现了有效的降噪和快速的稳定时间。采用0.18µm CMOS工艺制作的测试芯片的测量结果表明，有效封盖值提高了12倍，噪声降低了65.8%，沉降时间缩短了96%。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

查看原文本刊更多论文

Decoupling capacitance boosting for on-chip resonant supply noise reduction

This paper presents a decoupling capacitance boosting method for on-chip resonant supply noise reduction for DVS systems. The switching controls of decoupling capacitors depending on the supply noise states achieve an effective noise reduction and fast settling time simultaneously compared with the conventional passive decoupling capacitors. The measurement results of a test chip fabricated in a 0.18µm CMOS technology show 12X boost of effective decap value, and 65.8% supply noise reduction with 96% settling time improvement.

求助全文

通过发布文献求助，成功后即可免费获取论文全文。去求助

来源期刊

14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems

自引率

0.00%

发文量