S-Box和GF不同并发EDC方案的设计(p)

J. Mathew, H. Rahaman, A. Jabir, S. Mohanty, D. Pradhan
{"title":"S-Box和GF不同并发EDC方案的设计(p)","authors":"J. Mathew, H. Rahaman, A. Jabir, S. Mohanty, D. Pradhan","doi":"10.1109/ISQED.2010.5450467","DOIUrl":null,"url":null,"abstract":"Recent studies have shown that an attacker can retrieve confidential information from cryptographic hardware (e.g. the secret key) by introducing internal faults. A secure and reliable implementation of cryptographic algorithms in hardware must be able to detect or correct such malicious attacks. Error detection/correction (EDC), through fault tolerance, could be an effective way to mitigate such fault attacks in cryptographic hardware. To this end, we analyze the area, delay, and power overhead for designing the S-Box, which is one of the main complex blocks in the Advanced Encryption Standard (AES), with error detection and correction capability. We use multiple Parity Predictions (PPs), based on various error correcting codes, to detect and correct errors. Various coding techniques are presented, which include simple parity prediction, split parity codes, Hamming, Hsiao, and LDPC codes. The S-Box, GF(p), and PP circuits are synthesized from the specifications, while the decoding and correction circuits are combined to form the complete designs. The analysis shows a comparison of the different approaches characterized by their error detection capability.","PeriodicalId":369046,"journal":{"name":"2010 11th International Symposium on Quality Electronic Design (ISQED)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-03-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"15","resultStr":"{\"title\":\"On the design of different concurrent EDC schemes for S-Box and GF(p)\",\"authors\":\"J. Mathew, H. Rahaman, A. Jabir, S. Mohanty, D. Pradhan\",\"doi\":\"10.1109/ISQED.2010.5450467\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Recent studies have shown that an attacker can retrieve confidential information from cryptographic hardware (e.g. the secret key) by introducing internal faults. A secure and reliable implementation of cryptographic algorithms in hardware must be able to detect or correct such malicious attacks. Error detection/correction (EDC), through fault tolerance, could be an effective way to mitigate such fault attacks in cryptographic hardware. To this end, we analyze the area, delay, and power overhead for designing the S-Box, which is one of the main complex blocks in the Advanced Encryption Standard (AES), with error detection and correction capability. We use multiple Parity Predictions (PPs), based on various error correcting codes, to detect and correct errors. Various coding techniques are presented, which include simple parity prediction, split parity codes, Hamming, Hsiao, and LDPC codes. The S-Box, GF(p), and PP circuits are synthesized from the specifications, while the decoding and correction circuits are combined to form the complete designs. The analysis shows a comparison of the different approaches characterized by their error detection capability.\",\"PeriodicalId\":369046,\"journal\":{\"name\":\"2010 11th International Symposium on Quality Electronic Design (ISQED)\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2010-03-22\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"15\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2010 11th International Symposium on Quality Electronic Design (ISQED)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISQED.2010.5450467\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2010 11th International Symposium on Quality Electronic Design (ISQED)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISQED.2010.5450467","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 15

摘要

最近的研究表明,攻击者可以通过引入内部故障从加密硬件(例如秘密密钥)中检索机密信息。在硬件中安全可靠地实现加密算法必须能够检测或纠正此类恶意攻击。通过容错,错误检测/纠正(EDC)可能是减轻加密硬件中此类错误攻击的有效方法。S-Box是高级加密标准(Advanced Encryption Standard, AES)中主要的复杂块之一,具有错误检测和纠错功能,本文分析了S-Box设计的面积、延迟和功耗。我们使用基于各种纠错码的多个奇偶性预测(PPs)来检测和纠正错误。介绍了各种编码技术,包括简单奇偶预测、分割奇偶码、Hamming码、Hsiao码和LDPC码。根据规格合成S-Box、GF(p)、PP电路,结合译码和纠错电路构成完整的设计。分析比较了不同方法的错误检测能力。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
On the design of different concurrent EDC schemes for S-Box and GF(p)
Recent studies have shown that an attacker can retrieve confidential information from cryptographic hardware (e.g. the secret key) by introducing internal faults. A secure and reliable implementation of cryptographic algorithms in hardware must be able to detect or correct such malicious attacks. Error detection/correction (EDC), through fault tolerance, could be an effective way to mitigate such fault attacks in cryptographic hardware. To this end, we analyze the area, delay, and power overhead for designing the S-Box, which is one of the main complex blocks in the Advanced Encryption Standard (AES), with error detection and correction capability. We use multiple Parity Predictions (PPs), based on various error correcting codes, to detect and correct errors. Various coding techniques are presented, which include simple parity prediction, split parity codes, Hamming, Hsiao, and LDPC codes. The S-Box, GF(p), and PP circuits are synthesized from the specifications, while the decoding and correction circuits are combined to form the complete designs. The analysis shows a comparison of the different approaches characterized by their error detection capability.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信