{"title":"开发用于评估热电池和电池原型的测试器","authors":"R. Guidotti","doi":"10.1109/BCAA.1995.398536","DOIUrl":null,"url":null,"abstract":"A tester was developed to evaluate prototype thermal cells and batteries-especially high-voltage units-under a wide range of constant-current and constant-resistance discharge conditions. Programming of the steady-state and pulsing conditions was by software control or by hardware control via an external pulse generator. The tester was assembled from primarily Hewlett-Packard (H-P) instrumentation and was operated under H-P's Rocky Mountain Basic (RMB). Constant-current electronic loads rated up to 4 kW (400 V at up to 100 A) were successfully used with the setup. For testing under constant-resistance conditions, power metal-oxide field-effect transistors (MOSFETs) controlled by a programmable pulse generator were used to switch between steady-state and pulse loads. The pulses were digitized at up to a 50 kHz rate (20 /spl mu/ s/pt) using high-speed DVMs; steady-state voltages were monitored with standard DVMs. This paper describes several of the test configurations used and discusses the limitations of each. Representative data are presented for a number of the test conditions.<<ETX>>","PeriodicalId":423542,"journal":{"name":"Proceedings of the Tenth Annual Battery Conference on Applications and Advances","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1995-01-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Development of a tester for evaluation of prototype thermal cells and batteries\",\"authors\":\"R. Guidotti\",\"doi\":\"10.1109/BCAA.1995.398536\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A tester was developed to evaluate prototype thermal cells and batteries-especially high-voltage units-under a wide range of constant-current and constant-resistance discharge conditions. Programming of the steady-state and pulsing conditions was by software control or by hardware control via an external pulse generator. The tester was assembled from primarily Hewlett-Packard (H-P) instrumentation and was operated under H-P's Rocky Mountain Basic (RMB). Constant-current electronic loads rated up to 4 kW (400 V at up to 100 A) were successfully used with the setup. For testing under constant-resistance conditions, power metal-oxide field-effect transistors (MOSFETs) controlled by a programmable pulse generator were used to switch between steady-state and pulse loads. The pulses were digitized at up to a 50 kHz rate (20 /spl mu/ s/pt) using high-speed DVMs; steady-state voltages were monitored with standard DVMs. This paper describes several of the test configurations used and discusses the limitations of each. Representative data are presented for a number of the test conditions.<<ETX>>\",\"PeriodicalId\":423542,\"journal\":{\"name\":\"Proceedings of the Tenth Annual Battery Conference on Applications and Advances\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1995-01-10\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the Tenth Annual Battery Conference on Applications and Advances\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/BCAA.1995.398536\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the Tenth Annual Battery Conference on Applications and Advances","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/BCAA.1995.398536","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Development of a tester for evaluation of prototype thermal cells and batteries
A tester was developed to evaluate prototype thermal cells and batteries-especially high-voltage units-under a wide range of constant-current and constant-resistance discharge conditions. Programming of the steady-state and pulsing conditions was by software control or by hardware control via an external pulse generator. The tester was assembled from primarily Hewlett-Packard (H-P) instrumentation and was operated under H-P's Rocky Mountain Basic (RMB). Constant-current electronic loads rated up to 4 kW (400 V at up to 100 A) were successfully used with the setup. For testing under constant-resistance conditions, power metal-oxide field-effect transistors (MOSFETs) controlled by a programmable pulse generator were used to switch between steady-state and pulse loads. The pulses were digitized at up to a 50 kHz rate (20 /spl mu/ s/pt) using high-speed DVMs; steady-state voltages were monitored with standard DVMs. This paper describes several of the test configurations used and discusses the limitations of each. Representative data are presented for a number of the test conditions.<>