用于沟槽MOSFET和CSTBT的直接束引线键合

A. Narazaki, T. Shirasawa, T. Takayama, S. Sudo, S. Hirakawa, N. Asano, K. Ogata, H. Takahashi, T. Minato
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引用次数: 10

摘要

功率模块的下一个创新是通过无线键合技术,将CSTBT等功率芯片技术与直接转移模具模块等芯片封装技术相结合,即我们的“直接束引线键合(DBLB)”技术。在本文中,我们报告了使用DBLB的MOSFET和CSTBT的电特性和可靠性。DBLB型mosfet的导通状态电阻(R/sub DS(GN)/)与传统铝(Al)线键合型相比可降低16%,无阻尼电感开关(UIS)期间的雪崩坚固性(E/sub AVA/)未经证实约2倍。在233K ~ 398K的热循环测试中,在3000多次循环下,具有优异的可靠性。此外,DBLB型CSTBT在短路安全操作区(SCSOA)测试条件下的能量韧性比Al接线型高11%。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Direct beam lead bonding for trench MOSFET & CSTBT
The next innovation in the power modules has come up with the corroboration between the power chip technology like CSTBT and die packaging technology like the direct transfer mold module, via wireless bonding technology, that is our technology "direct beam lead bonding (DBLB)". In this paper, we report the electrical characteristics and the reliabilities of a MOSFET and a CSTBT using DBLB. The DBLB type MOSFETs on-state resistance (R/sub DS(GN)/) can be reduced in 16% comparing with die conventional aluminum (Al) wire bonding type and an avalanche ruggedness (E/sub AVA/) during undamped inductive switching (UIS) is unproved approximately 2 times. It has the excellent reliability under the thermal cycling test between 233K and 398K during over 3000 cycles. Further, the DBLB type CSTBT has, under the short circuit safety operation area (SCSOA) test condition, 11% greater toughness as energy than the Al wiring type.
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