TI-BIST:用于开关电容滤波器的温度无关模拟BIST

Proceedings of the Ninth Asian Test Symposium Pub Date : 2000-12-04 DOI:10.1109/ATS.2000.893606

L. Carro, É. Cota, M. Lubaszewski, Y. Bertrand, F. Azaïs, M. Renovell

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引用次数: 10

摘要

本文介绍了一种获得与温度无关的模拟BIST的方法。测试过程基于现有模拟电路的重用，配置为刺激发生器或签名分析仪。本文解释了模拟BIST中存在的温度偏差的一般问题，并给出了克服这一限制的方法，并通过仿真结果进行了验证。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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TI-BIST: a temperature independent analog BIST for switched-capacitor filters

This paper describes a method to obtain a temperature independent analog BIST. The test procedure is based on the reuse of existing analog circuits, configured either as stimuli generators or as signature analyzers. The paper explains the general problem of temperature deviation present in analog BIST, and shows an approach to overcome this limitation, validated by simulation results.

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Proceedings of the Ninth Asian Test Symposium

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