基于不变性的高级加密标准并发错误检测

Xiaofei Guo, R. Karri
{"title":"基于不变性的高级加密标准并发错误检测","authors":"Xiaofei Guo, R. Karri","doi":"10.1145/2228360.2228463","DOIUrl":null,"url":null,"abstract":"Naturally occurring and maliciously injected faults reduce the reliability of Advanced Encryption Standard (AES) and may leak confidential information. We developed an invariance-based concurrent error detection (CED) scheme which is independent of the implementation of AES encryption/decryption. Additionally, we improve the security of our scheme with Randomized CED Round Insertion and adaptive checking. Experimental results show that the invariance-based CED scheme detects all single-bit, all singlebyte fault, and 99.99999997% of burst faults. The area and delay overheads of this scheme are compared with those of previously reported CED schemes on two Xilinx Virtex FPGAs. The hardware overhead is in the 13.2-27.3% range and the throughput is between 1.8-42.2Gbps depending on the AES architecture, FPGA family, and the detection latency. One can implement our scheme in many ways; designers can trade off performance, reliability, and security according to the available resources.","PeriodicalId":263599,"journal":{"name":"DAC Design Automation Conference 2012","volume":"63 1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2012-06-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"40","resultStr":"{\"title\":\"Invariance-based concurrent error detection for Advanced Encryption Standard\",\"authors\":\"Xiaofei Guo, R. Karri\",\"doi\":\"10.1145/2228360.2228463\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Naturally occurring and maliciously injected faults reduce the reliability of Advanced Encryption Standard (AES) and may leak confidential information. We developed an invariance-based concurrent error detection (CED) scheme which is independent of the implementation of AES encryption/decryption. Additionally, we improve the security of our scheme with Randomized CED Round Insertion and adaptive checking. Experimental results show that the invariance-based CED scheme detects all single-bit, all singlebyte fault, and 99.99999997% of burst faults. The area and delay overheads of this scheme are compared with those of previously reported CED schemes on two Xilinx Virtex FPGAs. The hardware overhead is in the 13.2-27.3% range and the throughput is between 1.8-42.2Gbps depending on the AES architecture, FPGA family, and the detection latency. One can implement our scheme in many ways; designers can trade off performance, reliability, and security according to the available resources.\",\"PeriodicalId\":263599,\"journal\":{\"name\":\"DAC Design Automation Conference 2012\",\"volume\":\"63 1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2012-06-03\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"40\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"DAC Design Automation Conference 2012\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1145/2228360.2228463\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"DAC Design Automation Conference 2012","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1145/2228360.2228463","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 40

摘要

自然发生的故障和恶意注入的故障会降低AES (Advanced Encryption Standard)的可靠性,并可能泄露机密信息。我们开发了一个基于不变性的并发错误检测(CED)方案,该方案独立于AES加/解密的实现。此外,我们还利用随机化CED轮插入和自适应检查提高了方案的安全性。实验结果表明,基于不变性的CED方案可以检测到所有的单比特故障、所有的单字节故障和99.99999997%的突发故障。该方案的面积和延迟开销与先前报道的在两个Xilinx Virtex fpga上的CED方案进行了比较。硬件开销在13.2-27.3%之间,吞吐量在1.8-42.2Gbps之间,具体取决于AES架构、FPGA系列和检测延迟。我们可以用很多方法来实现我们的方案;设计人员可以根据可用资源权衡性能、可靠性和安全性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Invariance-based concurrent error detection for Advanced Encryption Standard
Naturally occurring and maliciously injected faults reduce the reliability of Advanced Encryption Standard (AES) and may leak confidential information. We developed an invariance-based concurrent error detection (CED) scheme which is independent of the implementation of AES encryption/decryption. Additionally, we improve the security of our scheme with Randomized CED Round Insertion and adaptive checking. Experimental results show that the invariance-based CED scheme detects all single-bit, all singlebyte fault, and 99.99999997% of burst faults. The area and delay overheads of this scheme are compared with those of previously reported CED schemes on two Xilinx Virtex FPGAs. The hardware overhead is in the 13.2-27.3% range and the throughput is between 1.8-42.2Gbps depending on the AES architecture, FPGA family, and the detection latency. One can implement our scheme in many ways; designers can trade off performance, reliability, and security according to the available resources.
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