模拟电路直流与瞬态响应测试的比较

ESSCIRC '92: Eighteenth European Solid-State Circuits conference Pub Date : 1992-09-01 DOI:10.1109/ESSCIRC.1992.5468407

D. Taylor, P. Evans, T. I. Pritchard

{"title":"模拟电路直流与瞬态响应测试的比较","authors":"D. Taylor, P. Evans, T. I. Pritchard","doi":"10.1109/ESSCIRC.1992.5468407","DOIUrl":null,"url":null,"abstract":"Transient Response Analysis [1] (TRA) is a quick and inexpensive method of testing analogue circuitry. In this paper we compare the effectiveness of traditional DC testing of analogue circuit cells with dynamic tests, using a simple analogue subcircuit element which models one component of a large mixed-signal ASIC.","PeriodicalId":242379,"journal":{"name":"ESSCIRC '92: Eighteenth European Solid-State Circuits conference","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1992-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"A Comparison of DC and Transient Response Tests for Analogue Circuits\",\"authors\":\"D. Taylor, P. Evans, T. I. Pritchard\",\"doi\":\"10.1109/ESSCIRC.1992.5468407\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Transient Response Analysis [1] (TRA) is a quick and inexpensive method of testing analogue circuitry. In this paper we compare the effectiveness of traditional DC testing of analogue circuit cells with dynamic tests, using a simple analogue subcircuit element which models one component of a large mixed-signal ASIC.\",\"PeriodicalId\":242379,\"journal\":{\"name\":\"ESSCIRC '92: Eighteenth European Solid-State Circuits conference\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1992-09-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"ESSCIRC '92: Eighteenth European Solid-State Circuits conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ESSCIRC.1992.5468407\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"ESSCIRC '92: Eighteenth European Solid-State Circuits conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ESSCIRC.1992.5468407","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 4

摘要

瞬态响应分析[1](TRA)是一种快速而廉价的测试模拟电路的方法。本文比较了模拟电路单元的传统直流测试和动态测试的有效性，使用一个简单的模拟子电路单元来模拟大型混合信号ASIC的一个组件。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

查看原文本刊更多论文

A Comparison of DC and Transient Response Tests for Analogue Circuits

Transient Response Analysis [1] (TRA) is a quick and inexpensive method of testing analogue circuitry. In this paper we compare the effectiveness of traditional DC testing of analogue circuit cells with dynamic tests, using a simple analogue subcircuit element which models one component of a large mixed-signal ASIC.

求助全文

通过发布文献求助，成功后即可免费获取论文全文。去求助

来源期刊

ESSCIRC '92: Eighteenth European Solid-State Circuits conference

自引率

0.00%

发文量