{"title":"电源管理集成电路一次性可编程测试的新方案","authors":"Yong Liang, Li Tao, Colin Xing","doi":"10.1109/CSTIC52283.2021.9461591","DOIUrl":null,"url":null,"abstract":"PMIC (Power Management Integrated Circuit) is the primary power management building block for multiple kinds of ICs (Processor, memory and miscellaneous peripherals). OTP (One Time Programable) test is used for trimming identical original PMIC devices to different versions as per different customers' requirement. Conventional OTP test solutions have constraints in flexibility, ease of use or cost aspects. This paper presents a new OTP test solution which breaks conventional OTP test solutions constraints. It is a reliable, flexible and easy to use low-cost OTP ATE (Automatic Test Equipment) test solution without using conventional testers.","PeriodicalId":186529,"journal":{"name":"2021 China Semiconductor Technology International Conference (CSTIC)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2021-03-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"A New Solution of Power Management Integrated Circuit One Time Programable Test\",\"authors\":\"Yong Liang, Li Tao, Colin Xing\",\"doi\":\"10.1109/CSTIC52283.2021.9461591\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"PMIC (Power Management Integrated Circuit) is the primary power management building block for multiple kinds of ICs (Processor, memory and miscellaneous peripherals). OTP (One Time Programable) test is used for trimming identical original PMIC devices to different versions as per different customers' requirement. Conventional OTP test solutions have constraints in flexibility, ease of use or cost aspects. This paper presents a new OTP test solution which breaks conventional OTP test solutions constraints. It is a reliable, flexible and easy to use low-cost OTP ATE (Automatic Test Equipment) test solution without using conventional testers.\",\"PeriodicalId\":186529,\"journal\":{\"name\":\"2021 China Semiconductor Technology International Conference (CSTIC)\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2021-03-14\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2021 China Semiconductor Technology International Conference (CSTIC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CSTIC52283.2021.9461591\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2021 China Semiconductor Technology International Conference (CSTIC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CSTIC52283.2021.9461591","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A New Solution of Power Management Integrated Circuit One Time Programable Test
PMIC (Power Management Integrated Circuit) is the primary power management building block for multiple kinds of ICs (Processor, memory and miscellaneous peripherals). OTP (One Time Programable) test is used for trimming identical original PMIC devices to different versions as per different customers' requirement. Conventional OTP test solutions have constraints in flexibility, ease of use or cost aspects. This paper presents a new OTP test solution which breaks conventional OTP test solutions constraints. It is a reliable, flexible and easy to use low-cost OTP ATE (Automatic Test Equipment) test solution without using conventional testers.
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