{"title":"用于ieee1149.1边界扫描标准接口端口的用户可编程宏单元发生器","authors":"Mark Royals, Tassos Markas, Nick Kanopoulos","doi":"10.1016/0165-6074(92)90359-F","DOIUrl":null,"url":null,"abstract":"<div><p>A silicon compilable macrocell implementing the IEEE S1149.1 Test Port has been developed and implemented to facilitate the use of the 1149.1 standard in application-specific integrated circuits (ASICs). The macrocell is intended as a drop-in block which supports the basic boundary-scan functions. Options are provided to support different possible user configurations (as supported by the 1149.1 standard) by merely recompiling the macrocell generator with a different set of user parameters.</p></div>","PeriodicalId":100927,"journal":{"name":"Microprocessing and Microprogramming","volume":"35 1","pages":"Pages 493-500"},"PeriodicalIF":0.0000,"publicationDate":"1992-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/0165-6074(92)90359-F","citationCount":"0","resultStr":"{\"title\":\"A user programmable macrocell generator for the IEEE 1149.1 boundary scan standard interface port\",\"authors\":\"Mark Royals, Tassos Markas, Nick Kanopoulos\",\"doi\":\"10.1016/0165-6074(92)90359-F\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><p>A silicon compilable macrocell implementing the IEEE S1149.1 Test Port has been developed and implemented to facilitate the use of the 1149.1 standard in application-specific integrated circuits (ASICs). The macrocell is intended as a drop-in block which supports the basic boundary-scan functions. Options are provided to support different possible user configurations (as supported by the 1149.1 standard) by merely recompiling the macrocell generator with a different set of user parameters.</p></div>\",\"PeriodicalId\":100927,\"journal\":{\"name\":\"Microprocessing and Microprogramming\",\"volume\":\"35 1\",\"pages\":\"Pages 493-500\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1992-09-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"https://sci-hub-pdf.com/10.1016/0165-6074(92)90359-F\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Microprocessing and Microprogramming\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://www.sciencedirect.com/science/article/pii/016560749290359F\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Microprocessing and Microprogramming","FirstCategoryId":"1085","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/016560749290359F","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A user programmable macrocell generator for the IEEE 1149.1 boundary scan standard interface port
A silicon compilable macrocell implementing the IEEE S1149.1 Test Port has been developed and implemented to facilitate the use of the 1149.1 standard in application-specific integrated circuits (ASICs). The macrocell is intended as a drop-in block which supports the basic boundary-scan functions. Options are provided to support different possible user configurations (as supported by the 1149.1 standard) by merely recompiling the macrocell generator with a different set of user parameters.
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