热处理对聚酰亚胺上纳米银丝网印刷柔性的影响

Kwang-Seok Kim, Young-Chul Lee, J. Ahn, Seung-Boo Jung
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引用次数: 2

摘要

我们评估了丝网印刷银(Ag)电路在不同烧结温度下的柔性。该电路是通过使用银纳米颗粒(73%,直径24 nm,银纳米颗粒)的丝网印刷技术在聚酰亚胺(PI)薄膜上构建的。将烧结温度从150℃提高到300℃,烧结时间固定为30 min。采用两种不同的方法测定了柔性;麻省理工学院(MIT)的类型折叠耐久性测试,以及互连和封装电子电路研究所(IPC)的抗弯曲耐久性测试。为了测量银电路在不同烧结温度下的柔性,观察了银印刷电路在折叠和滑动过程中电阻的变化。在较高温度下烧结的电路需要更多的滑动和折叠循环才能达到临界点:当烧结温度从150°C增加到300°C时,经过IPC滑动工艺和MIT折叠工艺的柔性分别下降了90%和75%左右。结果表明,随烧结温度的变化,印制电路的柔性受到微观结构变化的影响。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
The effect of heat treatment on flexibility of silver nanopaste circuit screen-printed on polyimide
We evaluated the flexibility of screen-printed silver (Ag) circuits under various sintering temperatures. The circuits were built on a polyimide (PI) film by a screen printing technique using Ag nanopaste (73 wt%, 24 nm in diameter, Ag nanoparticles). The sintering temperature was raised from 150 to 300 °C while the sintering time was fixed at 30 min. The flexibility was measured by two different kinds of methods; Massachussets Institute of Technology (MIT) type folding endurance test, and Institute for Interconnecting and Packaging Electronic Circuits (IPC) flexural resistance endurance test. In order to measure the flexibility of Ag circuits under various sintering temperatures, the changes of electrical resistance were observed while the printed Ag circuits were being folded or slid. The circuits sintered at higher temperatures needed more sliding and folding cycles to reach the critical point: while the sintering temperature increased from 150 °C to 300 °C, the flexibility decreased by around 90 % and 75 % after the IPC sliding process, and MIT folding process, respectively. The results showed that the flexibility of printed circuits was affected by the microstructural changes depending on the sintering temperature.
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