高I/O应用的高性价比陶瓷表面贴装封装

J. Miks
{"title":"高I/O应用的高性价比陶瓷表面贴装封装","authors":"J. Miks","doi":"10.1109/ICMCM.1994.753597","DOIUrl":null,"url":null,"abstract":"Ever since the push to eliminate through hole technology for maximized component density on printed wiring boards (PWB's), the cost for the surface mount technology (SMT) packages has escalated for high lead count devices (greater than 150 leads). The primary reason for this increase is the fact that to achieve reasonable package densities on the printed wiring boards (PWB's), fine pitch leaded devices are a necessity (less than 25 mil lead pitch). The industry is in desperate need of a cost effective SMT package design, and the Ceramic Ball Grid Array (CBGA) and/or the Ceramic Column Grid Array (CCGA) packages are the solution. This paper primarily focuses in on Ceramic Ball Grid Array (CBGA) and Ceramic Column Grid Array (CCGA) packaging, but does go into discussion of all existing packaging schemes on the market today for large die (greater than 5mm). Specifically, the advantages and disadvantages of fine pitch devices, detailed description of the 1.00mm interconnect pitch CBGA/CCGA packages, CBGA/CCGA standard package offerings (JEDEC registered), general package comparisons to each other (in the areas of thermal performance, electrical performance, size, cost, and overall component density on the PWB), solder interconnect fatigue properties of the CBGA/CCGA (i.e. predicted and measured low cycle fatigue life of the device), solder interconnect inspection of the CBGA/CCGA (should inspection be performed?), test and burn-in of the CBGA/CCGA devices, CBGA/CCGA device shipping method for pick and place and/or manual assembly, how to perform CBGA/CCGA board attach on existing PWB's (i.e. what are the manufacturing process differences for the CBGA/CCGA board attach process), and finally how to layout the PWB breakout pattern for the CBGA/CCGA to minimize the number of PWB routing layers.","PeriodicalId":363745,"journal":{"name":"Proceedings of the International Conference on Multichip Modules","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Cost effective ceramic surface mount packaging for high I/O applications\",\"authors\":\"J. Miks\",\"doi\":\"10.1109/ICMCM.1994.753597\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Ever since the push to eliminate through hole technology for maximized component density on printed wiring boards (PWB's), the cost for the surface mount technology (SMT) packages has escalated for high lead count devices (greater than 150 leads). The primary reason for this increase is the fact that to achieve reasonable package densities on the printed wiring boards (PWB's), fine pitch leaded devices are a necessity (less than 25 mil lead pitch). The industry is in desperate need of a cost effective SMT package design, and the Ceramic Ball Grid Array (CBGA) and/or the Ceramic Column Grid Array (CCGA) packages are the solution. This paper primarily focuses in on Ceramic Ball Grid Array (CBGA) and Ceramic Column Grid Array (CCGA) packaging, but does go into discussion of all existing packaging schemes on the market today for large die (greater than 5mm). Specifically, the advantages and disadvantages of fine pitch devices, detailed description of the 1.00mm interconnect pitch CBGA/CCGA packages, CBGA/CCGA standard package offerings (JEDEC registered), general package comparisons to each other (in the areas of thermal performance, electrical performance, size, cost, and overall component density on the PWB), solder interconnect fatigue properties of the CBGA/CCGA (i.e. predicted and measured low cycle fatigue life of the device), solder interconnect inspection of the CBGA/CCGA (should inspection be performed?), test and burn-in of the CBGA/CCGA devices, CBGA/CCGA device shipping method for pick and place and/or manual assembly, how to perform CBGA/CCGA board attach on existing PWB's (i.e. what are the manufacturing process differences for the CBGA/CCGA board attach process), and finally how to layout the PWB breakout pattern for the CBGA/CCGA to minimize the number of PWB routing layers.\",\"PeriodicalId\":363745,\"journal\":{\"name\":\"Proceedings of the International Conference on Multichip Modules\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1900-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the International Conference on Multichip Modules\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICMCM.1994.753597\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the International Conference on Multichip Modules","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICMCM.1994.753597","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

自从为了在印刷线路板(PWB)上实现元件密度最大化而取消通孔技术以来,对于高引线数器件(大于150引线),表面贴装技术(SMT)封装的成本已经升级。这种增加的主要原因是为了在印刷线路板(PWB)上实现合理的封装密度,必须使用细间距引线器件(引线间距小于25密耳)。业界迫切需要一种具有成本效益的SMT封装设计,陶瓷球网格阵列(CBGA)和/或陶瓷柱网格阵列(CCGA)封装是解决方案。本文主要关注陶瓷球网格阵列(CBGA)和陶瓷柱网格阵列(CCGA)封装,但确实讨论了目前市场上所有现有的大型模具封装方案(大于5mm)。具体来说,细间距器件的优点和缺点,详细描述1.00mm互连间距CBGA/CCGA封装,CBGA/CCGA标准封装产品(JEDEC注册),相互之间的一般封装比较(在热性能,电气性能,尺寸,成本和PWB上的整体组件密度方面),CBGA/CCGA的焊接互连疲劳性能(即预测和测量器件的低周疲劳寿命),CBGA/CCGA的焊料互连检查(应该进行检查吗?),CBGA/CCGA器件的测试和老化,CBGA/CCGA器件的拣选和放置和/或手工组装的运输方法,如何在现有的PWB上执行CBGA/CCGA板附加(即CBGA/CCGA板附加工艺的制造工艺差异是什么),以及最后如何布局CBGA/CCGA的PWB分线模式以减少PWB布线层的数量。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Cost effective ceramic surface mount packaging for high I/O applications
Ever since the push to eliminate through hole technology for maximized component density on printed wiring boards (PWB's), the cost for the surface mount technology (SMT) packages has escalated for high lead count devices (greater than 150 leads). The primary reason for this increase is the fact that to achieve reasonable package densities on the printed wiring boards (PWB's), fine pitch leaded devices are a necessity (less than 25 mil lead pitch). The industry is in desperate need of a cost effective SMT package design, and the Ceramic Ball Grid Array (CBGA) and/or the Ceramic Column Grid Array (CCGA) packages are the solution. This paper primarily focuses in on Ceramic Ball Grid Array (CBGA) and Ceramic Column Grid Array (CCGA) packaging, but does go into discussion of all existing packaging schemes on the market today for large die (greater than 5mm). Specifically, the advantages and disadvantages of fine pitch devices, detailed description of the 1.00mm interconnect pitch CBGA/CCGA packages, CBGA/CCGA standard package offerings (JEDEC registered), general package comparisons to each other (in the areas of thermal performance, electrical performance, size, cost, and overall component density on the PWB), solder interconnect fatigue properties of the CBGA/CCGA (i.e. predicted and measured low cycle fatigue life of the device), solder interconnect inspection of the CBGA/CCGA (should inspection be performed?), test and burn-in of the CBGA/CCGA devices, CBGA/CCGA device shipping method for pick and place and/or manual assembly, how to perform CBGA/CCGA board attach on existing PWB's (i.e. what are the manufacturing process differences for the CBGA/CCGA board attach process), and finally how to layout the PWB breakout pattern for the CBGA/CCGA to minimize the number of PWB routing layers.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信