千兆位DRAM的未来技术挑战

J.G. Lee
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引用次数: 0

摘要

在过去的7代中,从64K到256mb,很可能到1Gb DRAM的第8代,业界的成本/性能DRAM的发展遵循了一套在单元面积、芯片面积和性能方面非常一致的趋势。器件和电路设计的新概念以及技术创新是实现这些趋势的关键。如果这种趋势继续下去,千兆比特一代很可能需要一个新的断点。几个主要的技术创新领域已经成为满足要求的关键,例如光刻收缩能力(每一代1.4 /spl次),金属化水平和器件缩放的基本限制以满足性能目标(1.25/spl次/芯片级),由于电池面积缩小而产生的高介电材料以满足电池电容等。系统设计者将要求更高的性能。我们必须决定是通过技术解决方案还是通过架构解决方案解决性能问题,或者两者都解决。本文介绍了未来dram的技术和概念,重点介绍了其关键技术问题。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Future technology challenge for giga bit DRAM generation
Cost/performance DRAM developments in the industry have followed a set of remarkably consistent trends in cell area, chip area and performance for the last seven generation from 64K to 256 Mb and very likely through the eighth of 1Gb DRAM. New concepts on device and circuit design as well as technology innovations have been the key to allowing these trends to be met. The giga bit generation will very likely require a new breakpoint if the trends are to be continued. A few major areas of technology innovations have been key to the requirements, such as the lithography shrink ability (l.4/spl times/ each generation), levels of metallization and fundamental limitation of device scaling to meet performance goal (1.25/spl times/ chip level), high dielectric materials due to cell area reduction to meet cell capacitance, etc. The system designers will require higher performance. We must decide whether we tackle performance by a technological or by an architectural solution or both. This paper presents the highlights of the technology and concepts for future DRAMs with a focus on its key technology issues.
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