{"title":"具有多周期功能单元、异常和分支预测的超标量微处理器的正式验证","authors":"M. Velev, R. Bryant","doi":"10.1145/337292.337331","DOIUrl":null,"url":null,"abstract":"We extend the Burch and Dill flushing technique [6] for formal verification of microprocessors to be applicable to designs where the functional units and memories have multicycle and possibly arbitrary latency. We also show ways to incorporate exceptions and branch prediction by exploiting the properties of the logic of Positive Equality with Uninterpreted Functions [4][5]. We study the modeling of the above features in different versions of dual-issue superscalar processors.","PeriodicalId":237114,"journal":{"name":"Proceedings 37th Design Automation Conference","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2000-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"114","resultStr":"{\"title\":\"Formal verification of superscalar microprocessors with multicycle functional units, exceptions, and branch prediction\",\"authors\":\"M. Velev, R. Bryant\",\"doi\":\"10.1145/337292.337331\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We extend the Burch and Dill flushing technique [6] for formal verification of microprocessors to be applicable to designs where the functional units and memories have multicycle and possibly arbitrary latency. We also show ways to incorporate exceptions and branch prediction by exploiting the properties of the logic of Positive Equality with Uninterpreted Functions [4][5]. We study the modeling of the above features in different versions of dual-issue superscalar processors.\",\"PeriodicalId\":237114,\"journal\":{\"name\":\"Proceedings 37th Design Automation Conference\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2000-06-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"114\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings 37th Design Automation Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1145/337292.337331\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings 37th Design Automation Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1145/337292.337331","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Formal verification of superscalar microprocessors with multicycle functional units, exceptions, and branch prediction
We extend the Burch and Dill flushing technique [6] for formal verification of microprocessors to be applicable to designs where the functional units and memories have multicycle and possibly arbitrary latency. We also show ways to incorporate exceptions and branch prediction by exploiting the properties of the logic of Positive Equality with Uninterpreted Functions [4][5]. We study the modeling of the above features in different versions of dual-issue superscalar processors.