光伏组件旁路技术的性能基准

Kamran Ali Khan Niazi, Yongheng Yang, H. Khan, D. Sera
{"title":"光伏组件旁路技术的性能基准","authors":"Kamran Ali Khan Niazi, Yongheng Yang, H. Khan, D. Sera","doi":"10.1109/APEC.2019.8722259","DOIUrl":null,"url":null,"abstract":"The deployment of solar photovoltaic (PV) systems is increasing. The performance degradation of PV systems can happen, which is potentially induced by partial shading, also referred to as mismatch faults. Conventional PV modules are connected in series and are sensitive to mismatch faults. Bypass methods and other solutions are thus used to reduce the mismatch effect. This paper compares the performances of the bypassing techniques using traditional (Schottky) bypassing diodes with smart bypassing diodes (SBD). The benchmarking results show that the SBD can be employed to improve the performance during shading in PV systems. More specifically, the use of SBDs with series-connected MOSFETs leads to a reduction of the reverse voltage with a higher output power under various shading conditions, when compared to the case with traditional bypassing diodes. The reduction in the reserve voltage contributes to lowered temperature in shaded cells, and thus increases the reliability of the PV modules.","PeriodicalId":142409,"journal":{"name":"2019 IEEE Applied Power Electronics Conference and Exposition (APEC)","volume":"24 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-05-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":"{\"title\":\"Performance Benchmark of Bypassing Techniques for Photovoltaic Modules\",\"authors\":\"Kamran Ali Khan Niazi, Yongheng Yang, H. Khan, D. Sera\",\"doi\":\"10.1109/APEC.2019.8722259\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The deployment of solar photovoltaic (PV) systems is increasing. The performance degradation of PV systems can happen, which is potentially induced by partial shading, also referred to as mismatch faults. Conventional PV modules are connected in series and are sensitive to mismatch faults. Bypass methods and other solutions are thus used to reduce the mismatch effect. This paper compares the performances of the bypassing techniques using traditional (Schottky) bypassing diodes with smart bypassing diodes (SBD). The benchmarking results show that the SBD can be employed to improve the performance during shading in PV systems. More specifically, the use of SBDs with series-connected MOSFETs leads to a reduction of the reverse voltage with a higher output power under various shading conditions, when compared to the case with traditional bypassing diodes. The reduction in the reserve voltage contributes to lowered temperature in shaded cells, and thus increases the reliability of the PV modules.\",\"PeriodicalId\":142409,\"journal\":{\"name\":\"2019 IEEE Applied Power Electronics Conference and Exposition (APEC)\",\"volume\":\"24 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2019-05-24\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"7\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2019 IEEE Applied Power Electronics Conference and Exposition (APEC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/APEC.2019.8722259\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 IEEE Applied Power Electronics Conference and Exposition (APEC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/APEC.2019.8722259","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 7

摘要

太阳能光伏(PV)系统的部署正在增加。光伏系统的性能下降可能发生,这可能是由部分遮阳引起的,也称为失配故障。传统的光伏组件是串联的,对失配故障很敏感。因此,采用旁路方法和其他解决方案来减少失配效应。本文比较了传统(肖特基)旁路二极管和智能旁路二极管(SBD)旁路技术的性能。基准测试结果表明,SBD可用于改善光伏系统遮阳时的性能。更具体地说,与传统旁路二极管相比,sdd与串联mosfet的使用可以在各种遮光条件下降低反向电压并提高输出功率。储备电压的降低有助于降低遮阳电池的温度,从而提高光伏组件的可靠性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Performance Benchmark of Bypassing Techniques for Photovoltaic Modules
The deployment of solar photovoltaic (PV) systems is increasing. The performance degradation of PV systems can happen, which is potentially induced by partial shading, also referred to as mismatch faults. Conventional PV modules are connected in series and are sensitive to mismatch faults. Bypass methods and other solutions are thus used to reduce the mismatch effect. This paper compares the performances of the bypassing techniques using traditional (Schottky) bypassing diodes with smart bypassing diodes (SBD). The benchmarking results show that the SBD can be employed to improve the performance during shading in PV systems. More specifically, the use of SBDs with series-connected MOSFETs leads to a reduction of the reverse voltage with a higher output power under various shading conditions, when compared to the case with traditional bypassing diodes. The reduction in the reserve voltage contributes to lowered temperature in shaded cells, and thus increases the reliability of the PV modules.
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