一种110 nm 512 Mb DDR DRAM垂直晶体管沟槽电池

S. Wuensche, M. Jacunski, H. Streif, A. Sturm, J. Morrish, M. Roberge, M. Clark, T. Nostrand, E. Stahl, S. Lewis, J. Heath, M. Wood, T. Vogelsang, E. Thoma, J. Gabric, M. Kleiner, M. Killian, P. Poechmueller, W. Mueller, G. Bronner
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引用次数: 1

摘要

本文介绍了一种采用110纳米技术的512 Mb DDR SDRAM,该SDRAM基于高性价比的8F/sup 2/沟槽电容电池和双栅垂直通管。该产品还具有位线电压发生器,使用分布式输出晶体管和电源ir降校正方案。采用读/写选择性列激活电路优化高频操作。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A 110 nm 512 Mb DDR DRAM with vertical transistor trench cell
This paper describes a 512 Mb DDR SDRAM in 110 nm technology based on a highly cost efficient 8F/sup 2/ trench capacitor cell with a double gate vertical pass transistor. The product also features a bitline voltage generator using a distributed output transistor with a power supply IR-drop correction scheme. A read/write selective column activation circuit is employed to optimize high frequency operation.
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