S. Wuensche, M. Jacunski, H. Streif, A. Sturm, J. Morrish, M. Roberge, M. Clark, T. Nostrand, E. Stahl, S. Lewis, J. Heath, M. Wood, T. Vogelsang, E. Thoma, J. Gabric, M. Kleiner, M. Killian, P. Poechmueller, W. Mueller, G. Bronner
{"title":"一种110 nm 512 Mb DDR DRAM垂直晶体管沟槽电池","authors":"S. Wuensche, M. Jacunski, H. Streif, A. Sturm, J. Morrish, M. Roberge, M. Clark, T. Nostrand, E. Stahl, S. Lewis, J. Heath, M. Wood, T. Vogelsang, E. Thoma, J. Gabric, M. Kleiner, M. Killian, P. Poechmueller, W. Mueller, G. Bronner","doi":"10.1109/VLSIC.2002.1015059","DOIUrl":null,"url":null,"abstract":"This paper describes a 512 Mb DDR SDRAM in 110 nm technology based on a highly cost efficient 8F/sup 2/ trench capacitor cell with a double gate vertical pass transistor. The product also features a bitline voltage generator using a distributed output transistor with a power supply IR-drop correction scheme. A read/write selective column activation circuit is employed to optimize high frequency operation.","PeriodicalId":162493,"journal":{"name":"2002 Symposium on VLSI Circuits. Digest of Technical Papers (Cat. No.02CH37302)","volume":"129 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2002-06-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"A 110 nm 512 Mb DDR DRAM with vertical transistor trench cell\",\"authors\":\"S. Wuensche, M. Jacunski, H. Streif, A. Sturm, J. Morrish, M. Roberge, M. Clark, T. Nostrand, E. Stahl, S. Lewis, J. Heath, M. Wood, T. Vogelsang, E. Thoma, J. Gabric, M. Kleiner, M. Killian, P. Poechmueller, W. Mueller, G. Bronner\",\"doi\":\"10.1109/VLSIC.2002.1015059\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper describes a 512 Mb DDR SDRAM in 110 nm technology based on a highly cost efficient 8F/sup 2/ trench capacitor cell with a double gate vertical pass transistor. The product also features a bitline voltage generator using a distributed output transistor with a power supply IR-drop correction scheme. A read/write selective column activation circuit is employed to optimize high frequency operation.\",\"PeriodicalId\":162493,\"journal\":{\"name\":\"2002 Symposium on VLSI Circuits. Digest of Technical Papers (Cat. No.02CH37302)\",\"volume\":\"129 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2002-06-13\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2002 Symposium on VLSI Circuits. Digest of Technical Papers (Cat. No.02CH37302)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/VLSIC.2002.1015059\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2002 Symposium on VLSI Circuits. Digest of Technical Papers (Cat. No.02CH37302)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VLSIC.2002.1015059","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A 110 nm 512 Mb DDR DRAM with vertical transistor trench cell
This paper describes a 512 Mb DDR SDRAM in 110 nm technology based on a highly cost efficient 8F/sup 2/ trench capacitor cell with a double gate vertical pass transistor. The product also features a bitline voltage generator using a distributed output transistor with a power supply IR-drop correction scheme. A read/write selective column activation circuit is employed to optimize high frequency operation.