Bi/sub 4/Ti/sub 3/O/sub 12/-SrBi/sub 4/O/sub 15/和Bi/sub 3.25/La/sub 0.75/Ti/sub 3/O/sub 12/-SrBi/sub 4/Ti/sub 4/O/sub 15/陶瓷的微观结构研究

Proceedings of the 13th IEEE International Symposium on Applications of Ferroelectrics, 2002. ISAF 2002. Pub Date : 2002-05-28 DOI:10.1109/ISAF.2002.1195873

D. Su, J. Zhu, D.Y. Wang, H. Chad, C. Choy, Y.N. Wang

{"title":"Bi/sub 4/Ti/sub 3/O/sub 12/-SrBi/sub 4/O/sub 15/和Bi/sub 3.25/La/sub 0.75/Ti/sub 3/O/sub 12/-SrBi/sub 4/Ti/sub 4/O/sub 15/陶瓷的微观结构研究","authors":"D. Su, J. Zhu, D.Y. Wang, H. Chad, C. Choy, Y.N. Wang","doi":"10.1109/ISAF.2002.1195873","DOIUrl":null,"url":null,"abstract":"TEM study is preformed on mixed-layer type bismuth compounds: Bi/sub 4/Ti/sub 3/O/sub 12/-SrBi/sub 4/T/sub 4/O/sub 15/ (BT-SBTi) and Bi/sub 3.25/La/sub 0.75/Ti/sub 3/O/sub 12/-SrB/sub 4/T/sub 4/O/sub 15/ (BLT-SBTi) ceramics. Meeting the prediction of space group theory, APBs and 90/spl deg/ domain wall are observed by bright- and dark-field imaging in both materials. Besides, other planer defects are found and confirmed to be stacking faults.","PeriodicalId":415725,"journal":{"name":"Proceedings of the 13th IEEE International Symposium on Applications of Ferroelectrics, 2002. ISAF 2002.","volume":"8 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2002-05-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Microstructure study of Bi/sub 4/Ti/sub 3/O/sub 12/-SrBi/sub 4/O/sub 15/ and Bi/sub 3.25/La/sub 0.75/Ti/sub 3/O/sub 12/-SrBi/sub 4/Ti/sub 4/O/sub 15/ ceramics\",\"authors\":\"D. Su, J. Zhu, D.Y. Wang, H. Chad, C. Choy, Y.N. Wang\",\"doi\":\"10.1109/ISAF.2002.1195873\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"TEM study is preformed on mixed-layer type bismuth compounds: Bi/sub 4/Ti/sub 3/O/sub 12/-SrBi/sub 4/T/sub 4/O/sub 15/ (BT-SBTi) and Bi/sub 3.25/La/sub 0.75/Ti/sub 3/O/sub 12/-SrB/sub 4/T/sub 4/O/sub 15/ (BLT-SBTi) ceramics. Meeting the prediction of space group theory, APBs and 90/spl deg/ domain wall are observed by bright- and dark-field imaging in both materials. Besides, other planer defects are found and confirmed to be stacking faults.\",\"PeriodicalId\":415725,\"journal\":{\"name\":\"Proceedings of the 13th IEEE International Symposium on Applications of Ferroelectrics, 2002. ISAF 2002.\",\"volume\":\"8 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2002-05-28\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the 13th IEEE International Symposium on Applications of Ferroelectrics, 2002. ISAF 2002.\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISAF.2002.1195873\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 13th IEEE International Symposium on Applications of Ferroelectrics, 2002. ISAF 2002.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISAF.2002.1195873","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 0

摘要

用透射电镜研究了混合层型铋化合物Bi/sub 4/Ti/sub 3/O/sub 12/-SrBi/sub 4/T/sub 4/O/sub 15/ (BT-SBTi)和Bi/sub 3.25/La/sub 0.75/Ti/sub 3/O/sub 12/-SrB/sub 4/T/sub 4/O/sub 15/ (BLT-SBTi)陶瓷。根据空间群论的预测，两种材料的明暗场成像均观察到apb和90/spl度/畴壁。此外，还发现了其他刨床缺陷，并确认为堆积缺陷。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

查看原文本刊更多论文

Microstructure study of Bi/sub 4/Ti/sub 3/O/sub 12/-SrBi/sub 4/O/sub 15/ and Bi/sub 3.25/La/sub 0.75/Ti/sub 3/O/sub 12/-SrBi/sub 4/Ti/sub 4/O/sub 15/ ceramics

TEM study is preformed on mixed-layer type bismuth compounds: Bi/sub 4/Ti/sub 3/O/sub 12/-SrBi/sub 4/T/sub 4/O/sub 15/ (BT-SBTi) and Bi/sub 3.25/La/sub 0.75/Ti/sub 3/O/sub 12/-SrB/sub 4/T/sub 4/O/sub 15/ (BLT-SBTi) ceramics. Meeting the prediction of space group theory, APBs and 90/spl deg/ domain wall are observed by bright- and dark-field imaging in both materials. Besides, other planer defects are found and confirmed to be stacking faults.

求助全文

通过发布文献求助，成功后即可免费获取论文全文。去求助

来源期刊

Proceedings of the 13th IEEE International Symposium on Applications of Ferroelectrics, 2002. ISAF 2002.

自引率

0.00%

发文量