{"title":"器件仿真程序中的假设和权衡","authors":"M. Lundstrom","doi":"10.1109/BIPOL.1992.274087","DOIUrl":null,"url":null,"abstract":"The author examines the physical assumptions which underlie device simulation programs and considers their implications for advanced bipolar transistors. The limits of drift-diffusion equations are discussed, and advanced techniques such as hydrodynamic and Monte Carlo approaches are described. Some thoughts on the device simulation requirements for future generation bipolar transistors are also presented.<<ETX>>","PeriodicalId":286222,"journal":{"name":"Proceedings of the 1992 Bipolar/BiCMOS Circuits and Technology Meeting","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1992-10-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Assumptions and trade-offs in device simulation programs\",\"authors\":\"M. Lundstrom\",\"doi\":\"10.1109/BIPOL.1992.274087\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The author examines the physical assumptions which underlie device simulation programs and considers their implications for advanced bipolar transistors. The limits of drift-diffusion equations are discussed, and advanced techniques such as hydrodynamic and Monte Carlo approaches are described. Some thoughts on the device simulation requirements for future generation bipolar transistors are also presented.<<ETX>>\",\"PeriodicalId\":286222,\"journal\":{\"name\":\"Proceedings of the 1992 Bipolar/BiCMOS Circuits and Technology Meeting\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1992-10-07\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the 1992 Bipolar/BiCMOS Circuits and Technology Meeting\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/BIPOL.1992.274087\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 1992 Bipolar/BiCMOS Circuits and Technology Meeting","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/BIPOL.1992.274087","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Assumptions and trade-offs in device simulation programs
The author examines the physical assumptions which underlie device simulation programs and considers their implications for advanced bipolar transistors. The limits of drift-diffusion equations are discussed, and advanced techniques such as hydrodynamic and Monte Carlo approaches are described. Some thoughts on the device simulation requirements for future generation bipolar transistors are also presented.<>