{"title":"大规模并行GPU-SPICE中大型电路的可靠性估计","authors":"Victor M. van Santen, H. Amrouch, J. Henkel","doi":"10.1109/IOLTS.2018.8474096","DOIUrl":null,"url":null,"abstract":"SPICE simulations for reliability have special requirements. We present GPU-SPICE to serve these special requirements. First, our GPU-SPICE employs the massive parallelism found in GPUs to enable circuit simulations beyond $200K$ transistors. This is necessary to study reliability in micro-architecture components (e.g., multipliers, adders), as reliability estimations require full analogue SPICE simulations (instead of STA or other heuristics). Secondly, our GPU-SPICE can update transistor parameters during the circuit simulation, a feature necessary to model reliability degradation, which constantly reacts to circuit activity (e.g., Bias Temperature Instability reacting to $V_{gs}$ changes by increasing/decreasing $\\Delta V_{th}$ in each transistor). Lastly, our GPU-SPICE is open-source software, this ensures that it easily can be employed, adapted and extended by other researchers. Due to the massive parallelism in a GPU and performance optimizations (convergence criteria, CUDA memory management, etc.), our GPU-SPICE is up to 218x faster than its single-threaded baseline NGSPICE.","PeriodicalId":241735,"journal":{"name":"2018 IEEE 24th International Symposium on On-Line Testing And Robust System Design (IOLTS)","volume":"9 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-07-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"Reliability Estimations of Large Circuits in Massively-Parallel GPU-SPICE\",\"authors\":\"Victor M. van Santen, H. Amrouch, J. Henkel\",\"doi\":\"10.1109/IOLTS.2018.8474096\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"SPICE simulations for reliability have special requirements. We present GPU-SPICE to serve these special requirements. First, our GPU-SPICE employs the massive parallelism found in GPUs to enable circuit simulations beyond $200K$ transistors. This is necessary to study reliability in micro-architecture components (e.g., multipliers, adders), as reliability estimations require full analogue SPICE simulations (instead of STA or other heuristics). Secondly, our GPU-SPICE can update transistor parameters during the circuit simulation, a feature necessary to model reliability degradation, which constantly reacts to circuit activity (e.g., Bias Temperature Instability reacting to $V_{gs}$ changes by increasing/decreasing $\\\\Delta V_{th}$ in each transistor). Lastly, our GPU-SPICE is open-source software, this ensures that it easily can be employed, adapted and extended by other researchers. Due to the massive parallelism in a GPU and performance optimizations (convergence criteria, CUDA memory management, etc.), our GPU-SPICE is up to 218x faster than its single-threaded baseline NGSPICE.\",\"PeriodicalId\":241735,\"journal\":{\"name\":\"2018 IEEE 24th International Symposium on On-Line Testing And Robust System Design (IOLTS)\",\"volume\":\"9 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2018-07-02\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2018 IEEE 24th International Symposium on On-Line Testing And Robust System Design (IOLTS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IOLTS.2018.8474096\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 IEEE 24th International Symposium on On-Line Testing And Robust System Design (IOLTS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IOLTS.2018.8474096","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Reliability Estimations of Large Circuits in Massively-Parallel GPU-SPICE
SPICE simulations for reliability have special requirements. We present GPU-SPICE to serve these special requirements. First, our GPU-SPICE employs the massive parallelism found in GPUs to enable circuit simulations beyond $200K$ transistors. This is necessary to study reliability in micro-architecture components (e.g., multipliers, adders), as reliability estimations require full analogue SPICE simulations (instead of STA or other heuristics). Secondly, our GPU-SPICE can update transistor parameters during the circuit simulation, a feature necessary to model reliability degradation, which constantly reacts to circuit activity (e.g., Bias Temperature Instability reacting to $V_{gs}$ changes by increasing/decreasing $\Delta V_{th}$ in each transistor). Lastly, our GPU-SPICE is open-source software, this ensures that it easily can be employed, adapted and extended by other researchers. Due to the massive parallelism in a GPU and performance optimizations (convergence criteria, CUDA memory management, etc.), our GPU-SPICE is up to 218x faster than its single-threaded baseline NGSPICE.