{"title":"用于平面芯片对芯片通信的亚太赫兹互连通道","authors":"Bo Yu, Y. Ye, X. Liu, Q. Gu","doi":"10.1109/ISEMC.2016.7571770","DOIUrl":null,"url":null,"abstract":"This article presents the dielectric waveguide based sub-THz interconnect channels for high bandwidth-density and high energy-efficiency chip-to-chip communications. Both far-field and near-field transition based channels are analyzed and demonstrated. The insertion losses of the interconnect with far-field transitions and near-field transitions are about 8.4 dB with 12.6 GHz 3-dB bandwidth and 4.0 dB with 59 GHz 3-dB bandwidth, respectively.","PeriodicalId":326016,"journal":{"name":"2016 IEEE International Symposium on Electromagnetic Compatibility (EMC)","volume":"23 10 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-07-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Sub-THz interconnect channel for planar chip-to-chip communication\",\"authors\":\"Bo Yu, Y. Ye, X. Liu, Q. Gu\",\"doi\":\"10.1109/ISEMC.2016.7571770\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This article presents the dielectric waveguide based sub-THz interconnect channels for high bandwidth-density and high energy-efficiency chip-to-chip communications. Both far-field and near-field transition based channels are analyzed and demonstrated. The insertion losses of the interconnect with far-field transitions and near-field transitions are about 8.4 dB with 12.6 GHz 3-dB bandwidth and 4.0 dB with 59 GHz 3-dB bandwidth, respectively.\",\"PeriodicalId\":326016,\"journal\":{\"name\":\"2016 IEEE International Symposium on Electromagnetic Compatibility (EMC)\",\"volume\":\"23 10 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2016-07-25\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2016 IEEE International Symposium on Electromagnetic Compatibility (EMC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISEMC.2016.7571770\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 IEEE International Symposium on Electromagnetic Compatibility (EMC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISEMC.2016.7571770","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Sub-THz interconnect channel for planar chip-to-chip communication
This article presents the dielectric waveguide based sub-THz interconnect channels for high bandwidth-density and high energy-efficiency chip-to-chip communications. Both far-field and near-field transition based channels are analyzed and demonstrated. The insertion losses of the interconnect with far-field transitions and near-field transitions are about 8.4 dB with 12.6 GHz 3-dB bandwidth and 4.0 dB with 59 GHz 3-dB bandwidth, respectively.