{"title":"一种改进的用于校准带性别的VANA测试端口的开放方式","authors":"G. Simpson","doi":"10.1109/ARFTG.1986.323667","DOIUrl":null,"url":null,"abstract":"The reference plane of current open circuit standards can vary with test port tolerances when used to calibrate Vector Automatic Network Analyzers (VANA's) with sexed connectors. This causes a significant measurement uncertainty. The improved design captivates the center contact of the open to make it independant of the test port.","PeriodicalId":261285,"journal":{"name":"27th ARFTG Conference Digest","volume":"49 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1986-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"An Improved Open for Calibrating Sexed VANA Test Ports\",\"authors\":\"G. Simpson\",\"doi\":\"10.1109/ARFTG.1986.323667\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The reference plane of current open circuit standards can vary with test port tolerances when used to calibrate Vector Automatic Network Analyzers (VANA's) with sexed connectors. This causes a significant measurement uncertainty. The improved design captivates the center contact of the open to make it independant of the test port.\",\"PeriodicalId\":261285,\"journal\":{\"name\":\"27th ARFTG Conference Digest\",\"volume\":\"49 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1986-06-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"27th ARFTG Conference Digest\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ARFTG.1986.323667\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"27th ARFTG Conference Digest","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ARFTG.1986.323667","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
An Improved Open for Calibrating Sexed VANA Test Ports
The reference plane of current open circuit standards can vary with test port tolerances when used to calibrate Vector Automatic Network Analyzers (VANA's) with sexed connectors. This causes a significant measurement uncertainty. The improved design captivates the center contact of the open to make it independant of the test port.
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