Endah Rahmawati, Riska Ekawita, M. Abdullah, Khairurrijal
{"title":"一个简单和廉价的C-V表征系统在电子本科课程","authors":"Endah Rahmawati, Riska Ekawita, M. Abdullah, Khairurrijal","doi":"10.1109/ICICI-BME.2009.5417215","DOIUrl":null,"url":null,"abstract":"A simple and inexpensive capacitance-voltage (C-V) meter based on C8051F006 SoC has been developed for characterizing electronic components. It can be a tool in laboratory to strengthen concepts delivered in lectures and also make students familiar with the characteristic equation of electronics components. The instrumentation design of C-V meter consist of a voltage source generated by DAC and voltage step source applied to device under test (DUT) and its capacitance, which is measured by C-V meter, are stored into computer via an RS-232 serial communication. The C-V meter calibrated for each part and tested for measuring C-V characteristics of capacitor and diodes. The result of the measurement is a curve characterization of C-V. The curves have been compared to the theory as qualitative.","PeriodicalId":191194,"journal":{"name":"International Conference on Instrumentation, Communication, Information Technology, and Biomedical Engineering 2009","volume":"56 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2009-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"A simple and inexpensive C-V characterization system for electronics course at undergraduate level\",\"authors\":\"Endah Rahmawati, Riska Ekawita, M. Abdullah, Khairurrijal\",\"doi\":\"10.1109/ICICI-BME.2009.5417215\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A simple and inexpensive capacitance-voltage (C-V) meter based on C8051F006 SoC has been developed for characterizing electronic components. It can be a tool in laboratory to strengthen concepts delivered in lectures and also make students familiar with the characteristic equation of electronics components. The instrumentation design of C-V meter consist of a voltage source generated by DAC and voltage step source applied to device under test (DUT) and its capacitance, which is measured by C-V meter, are stored into computer via an RS-232 serial communication. The C-V meter calibrated for each part and tested for measuring C-V characteristics of capacitor and diodes. The result of the measurement is a curve characterization of C-V. The curves have been compared to the theory as qualitative.\",\"PeriodicalId\":191194,\"journal\":{\"name\":\"International Conference on Instrumentation, Communication, Information Technology, and Biomedical Engineering 2009\",\"volume\":\"56 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2009-11-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"International Conference on Instrumentation, Communication, Information Technology, and Biomedical Engineering 2009\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICICI-BME.2009.5417215\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"International Conference on Instrumentation, Communication, Information Technology, and Biomedical Engineering 2009","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICICI-BME.2009.5417215","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A simple and inexpensive C-V characterization system for electronics course at undergraduate level
A simple and inexpensive capacitance-voltage (C-V) meter based on C8051F006 SoC has been developed for characterizing electronic components. It can be a tool in laboratory to strengthen concepts delivered in lectures and also make students familiar with the characteristic equation of electronics components. The instrumentation design of C-V meter consist of a voltage source generated by DAC and voltage step source applied to device under test (DUT) and its capacitance, which is measured by C-V meter, are stored into computer via an RS-232 serial communication. The C-V meter calibrated for each part and tested for measuring C-V characteristics of capacitor and diodes. The result of the measurement is a curve characterization of C-V. The curves have been compared to the theory as qualitative.