{"title":"基于神经网络的碳纳米管晶体管建模","authors":"Ahmed Abo-Elhadeed","doi":"10.1109/SMACD.2012.6339433","DOIUrl":null,"url":null,"abstract":"A model for carbon nanotube field-effect transistors (CNTFETs) is developed using neural networks approach. This model accurately predicts the I-V characteristics for different structures of CNTFETs. The model is implemented inside the circuit simulator Eldo using its general user defined model (GUDM) template. To confirm the accuracy of the proposed model, the I-V characteristics are compared to device simulation results. The model is also validated using experimental data for both shottky barrier and conventional CNTFETs. The model shows excellent fitting for both the experimental and device simulation data with average percentage error doesn't exceed 1%.","PeriodicalId":181205,"journal":{"name":"2012 International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD)","volume":"53 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2012-10-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"Modeling carbon nanotube transistors using neural networks approach\",\"authors\":\"Ahmed Abo-Elhadeed\",\"doi\":\"10.1109/SMACD.2012.6339433\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A model for carbon nanotube field-effect transistors (CNTFETs) is developed using neural networks approach. This model accurately predicts the I-V characteristics for different structures of CNTFETs. The model is implemented inside the circuit simulator Eldo using its general user defined model (GUDM) template. To confirm the accuracy of the proposed model, the I-V characteristics are compared to device simulation results. The model is also validated using experimental data for both shottky barrier and conventional CNTFETs. The model shows excellent fitting for both the experimental and device simulation data with average percentage error doesn't exceed 1%.\",\"PeriodicalId\":181205,\"journal\":{\"name\":\"2012 International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD)\",\"volume\":\"53 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2012-10-25\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2012 International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/SMACD.2012.6339433\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2012 International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SMACD.2012.6339433","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Modeling carbon nanotube transistors using neural networks approach
A model for carbon nanotube field-effect transistors (CNTFETs) is developed using neural networks approach. This model accurately predicts the I-V characteristics for different structures of CNTFETs. The model is implemented inside the circuit simulator Eldo using its general user defined model (GUDM) template. To confirm the accuracy of the proposed model, the I-V characteristics are compared to device simulation results. The model is also validated using experimental data for both shottky barrier and conventional CNTFETs. The model shows excellent fitting for both the experimental and device simulation data with average percentage error doesn't exceed 1%.