{"title":"嵌入式微处理器高效在线自测测试例程的动态调度","authors":"N. Bartzoudis, V. Tantsios, K. Mcdonald-Maier","doi":"10.1109/IOLTS.2008.55","DOIUrl":null,"url":null,"abstract":"This paper presents a self-testing framework targeting the LEON3 embedded microprocessor with built-in test-scheduling features. The proposed design exploits existing post production test sets, designed for software-based testing of embedded microprocessors. The framework also includes a constraint-based approach of test-routine scheduling. The initial results show that the test execution time could be dynamically scaled by the test selection algorithm.","PeriodicalId":261786,"journal":{"name":"2008 14th IEEE International On-Line Testing Symposium","volume":"49 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2008-07-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"9","resultStr":"{\"title\":\"Dynamic Scheduling of Test Routines for Efficient Online Self-Testing of Embedded Microprocessors\",\"authors\":\"N. Bartzoudis, V. Tantsios, K. Mcdonald-Maier\",\"doi\":\"10.1109/IOLTS.2008.55\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents a self-testing framework targeting the LEON3 embedded microprocessor with built-in test-scheduling features. The proposed design exploits existing post production test sets, designed for software-based testing of embedded microprocessors. The framework also includes a constraint-based approach of test-routine scheduling. The initial results show that the test execution time could be dynamically scaled by the test selection algorithm.\",\"PeriodicalId\":261786,\"journal\":{\"name\":\"2008 14th IEEE International On-Line Testing Symposium\",\"volume\":\"49 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2008-07-07\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"9\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2008 14th IEEE International On-Line Testing Symposium\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IOLTS.2008.55\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2008 14th IEEE International On-Line Testing Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IOLTS.2008.55","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Dynamic Scheduling of Test Routines for Efficient Online Self-Testing of Embedded Microprocessors
This paper presents a self-testing framework targeting the LEON3 embedded microprocessor with built-in test-scheduling features. The proposed design exploits existing post production test sets, designed for software-based testing of embedded microprocessors. The framework also includes a constraint-based approach of test-routine scheduling. The initial results show that the test execution time could be dynamically scaled by the test selection algorithm.
求助内容：
应助结果提醒方式：
京公网安备 11010802042870号
