深沟槽中SU-8光刻胶的研究

E. Laforge, Caroline Rabot, Ningning Wang, Z. Pavlović, P. McCloskey, C. O'Mathúna
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引用次数: 0

摘要

环氧基抗蚀剂SU-8广泛应用于高纵横比(HAR) MEMS结构的开发和制造。它是一种适合的光刻胶,具有较厚的涂层和良好的附着力,并具有良好的机械和化学稳定性。然而,小型化的趋势和包装密度的增加推动了对具有挑战性的微加工工艺的需求。例如,一种新的MEMS微电感器设计需要在深硅沟槽中涂覆一层介电永久层,以便将铜绕组与沉积在这些沟槽中的磁性材料隔离开来。这就要求开发一种光刻工艺,使无空洞层的涂层能够填充沟槽。本文研究了厚SU-8光刻胶在深硅沟槽填充中的应用。对不同的SU-8配方进行了分析、加工,并对结果进行了比较。因此,开发了一种优化工艺,以实现无空隙填充沟槽及其上方均匀的平面层,具有接近垂直的侧壁图案。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A study of SU-8 photoresist in deep trenches for silicon-embedded microinductors
Epoxy-based resist SU-8 is widely used in the development and fabrication of high-aspect-ratio (HAR) MEMS structures. It has proven to be a suitable photoresist combining thick layer coating and good adhesion on silicon substrates as well as possessing good mechanical and chemical stability. However, the trend towards minia- turization and increasing packaging density has pushed the demand for challenging micro-machining processes. As an example, a novel design of a MEMS microinductor requires a dielectric permanent layer coated in deep silicon trenches in order to insulate copper windings from the magnetic material deposited in these trenches. This requires the development of a photolithography process which enables the coating of a void-free layer filling the trenches. In this paper, the use of thick SU-8 photoresist for filling deep silicon trenches is investigated. Different SU-8 formulations are analyzed, processed and results are compared. As a result, an optimized process is developed to achieve void-free filled trenches and a uniform planar layer above them, with near vertical sidewall patterns.
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