{"title":"系统芯片测试策略","authors":"Y. Zorian","doi":"10.1145/277044.277234","DOIUrl":null,"url":null,"abstract":"A major challenge in realizing core-based system-chips is the adoption of adequate test and diagnosis strategies. This paper focuses on the current industrial practices in test strategies for system-chips. It discusses the challenges in testing embedded cores, the testing requirements for individual cores, and their test access mechanisms. It also covers the integrated test strategies for system-chips based on reusable cores. In addition to the state-of-the-art practices in testability schemes, this paper covers the current standardization efforts for embedded core test interface mechanisms.","PeriodicalId":221221,"journal":{"name":"Proceedings 1998 Design and Automation Conference. 35th DAC. (Cat. No.98CH36175)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1998-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"31","resultStr":"{\"title\":\"System-chip test strategies\",\"authors\":\"Y. Zorian\",\"doi\":\"10.1145/277044.277234\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A major challenge in realizing core-based system-chips is the adoption of adequate test and diagnosis strategies. This paper focuses on the current industrial practices in test strategies for system-chips. It discusses the challenges in testing embedded cores, the testing requirements for individual cores, and their test access mechanisms. It also covers the integrated test strategies for system-chips based on reusable cores. In addition to the state-of-the-art practices in testability schemes, this paper covers the current standardization efforts for embedded core test interface mechanisms.\",\"PeriodicalId\":221221,\"journal\":{\"name\":\"Proceedings 1998 Design and Automation Conference. 35th DAC. (Cat. No.98CH36175)\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1998-05-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"31\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings 1998 Design and Automation Conference. 35th DAC. (Cat. No.98CH36175)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1145/277044.277234\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings 1998 Design and Automation Conference. 35th DAC. (Cat. No.98CH36175)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1145/277044.277234","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A major challenge in realizing core-based system-chips is the adoption of adequate test and diagnosis strategies. This paper focuses on the current industrial practices in test strategies for system-chips. It discusses the challenges in testing embedded cores, the testing requirements for individual cores, and their test access mechanisms. It also covers the integrated test strategies for system-chips based on reusable cores. In addition to the state-of-the-art practices in testability schemes, this paper covers the current standardization efforts for embedded core test interface mechanisms.