系统芯片测试策略

Y. Zorian
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引用次数: 31

摘要

实现基于核心的系统芯片的一个主要挑战是采用适当的测试和诊断策略。本文重点介绍了当前系统芯片测试策略的工业实践。它讨论了测试嵌入式内核的挑战、单个内核的测试需求以及它们的测试访问机制。它还涵盖了基于可重用核心的系统芯片的集成测试策略。除了可测试性方案的最新实践之外,本文还涵盖了嵌入式核心测试接口机制的当前标准化工作。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
System-chip test strategies
A major challenge in realizing core-based system-chips is the adoption of adequate test and diagnosis strategies. This paper focuses on the current industrial practices in test strategies for system-chips. It discusses the challenges in testing embedded cores, the testing requirements for individual cores, and their test access mechanisms. It also covers the integrated test strategies for system-chips based on reusable cores. In addition to the state-of-the-art practices in testability schemes, this paper covers the current standardization efforts for embedded core test interface mechanisms.
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