矢量存储器扩展系统，用于T33XX逻辑测试仪

Proceedings of the 11th Asian Test Symposium, 2002. (ATS '02). Pub Date : 2002-11-18 DOI:10.1109/ATS.2002.1181743

Kazuhiro Yamada, Yoshikazu Takahashi

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引用次数: 0

摘要

本文介绍了一种适用于Advantest T33XX系列逻辑测试仪的低成本存储器扩展系统。采用该系统，T33XX测试仪具有与T6672测试仪相同的性能。该系统允许T33XX用于ASIC晶圆测试直到2010年。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Vector memory expansion system for T33XX logic tester

This paper describes a low-cost memory expansion system for the Advantest T33XX logic tester series. Using this system, the T33XX tester has the same capability as the T6672 tester. This system allows the T33XX to be used for ASIC wafer testing until 2010.

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Proceedings of the 11th Asian Test Symposium, 2002. (ATS '02).

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