{"title":"基准电路提高了标准单元库的质量","authors":"Rung-Bin Lin, I. S. Chou, Chi-Ming Tsai","doi":"10.1109/ASPDAC.1999.759988","DOIUrl":null,"url":null,"abstract":"The experience of designing and employing two benchmark circuits to improve the quality of a standard cell library is reported. It is found that most of the errors can be uncovered by making use of these two benchmark circuits to port the underlying cell library to the target environment. Two releases of a 0.25 /spl mu/m standard cell library have been tested by these two benchmark circuits to ensure their quality.","PeriodicalId":201352,"journal":{"name":"Proceedings of the ASP-DAC '99 Asia and South Pacific Design Automation Conference 1999 (Cat. No.99EX198)","volume":"34 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1999-01-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"8","resultStr":"{\"title\":\"Benchmark circuits improve the quality of a standard cell library\",\"authors\":\"Rung-Bin Lin, I. S. Chou, Chi-Ming Tsai\",\"doi\":\"10.1109/ASPDAC.1999.759988\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The experience of designing and employing two benchmark circuits to improve the quality of a standard cell library is reported. It is found that most of the errors can be uncovered by making use of these two benchmark circuits to port the underlying cell library to the target environment. Two releases of a 0.25 /spl mu/m standard cell library have been tested by these two benchmark circuits to ensure their quality.\",\"PeriodicalId\":201352,\"journal\":{\"name\":\"Proceedings of the ASP-DAC '99 Asia and South Pacific Design Automation Conference 1999 (Cat. No.99EX198)\",\"volume\":\"34 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1999-01-18\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"8\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the ASP-DAC '99 Asia and South Pacific Design Automation Conference 1999 (Cat. No.99EX198)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ASPDAC.1999.759988\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the ASP-DAC '99 Asia and South Pacific Design Automation Conference 1999 (Cat. No.99EX198)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ASPDAC.1999.759988","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Benchmark circuits improve the quality of a standard cell library
The experience of designing and employing two benchmark circuits to improve the quality of a standard cell library is reported. It is found that most of the errors can be uncovered by making use of these two benchmark circuits to port the underlying cell library to the target environment. Two releases of a 0.25 /spl mu/m standard cell library have been tested by these two benchmark circuits to ensure their quality.