基准电路提高了标准单元库的质量

Rung-Bin Lin, I. S. Chou, Chi-Ming Tsai
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引用次数: 8

摘要

本文报道了设计和使用两个基准电路来提高标准单元库质量的经验。通过使用这两个基准电路将底层单元库移植到目标环境中,可以发现大多数错误。两个版本的0.25 /spl mu/m标准单元库已通过这两个基准电路进行测试,以确保其质量。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Benchmark circuits improve the quality of a standard cell library
The experience of designing and employing two benchmark circuits to improve the quality of a standard cell library is reported. It is found that most of the errors can be uncovered by making use of these two benchmark circuits to port the underlying cell library to the target environment. Two releases of a 0.25 /spl mu/m standard cell library have been tested by these two benchmark circuits to ensure their quality.
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