测温特性对实验室自制SiC肖特基二极管结温测量精度的影响

2018 Baltic URSI Symposium (URSI) Pub Date : 2018-05-15 DOI:10.23919/URSI.2018.8406709

P. Górecki, K. Górecki, R. Kisiel, M. Myśliwiec

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引用次数: 2

摘要

本文介绍了碳化硅肖特基二极管测温特性的测试结果。这些特性被用于间接电法测量半导体器件的结温。描述了所检测的二极管，并给出了热学和电学测量的结果。研究了测量电流对测温特性的影响。对结点温度估计误差进行了深入的研究和描述。

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Influence of thermometric characteristics on accuracy of junction temperature measurements of laboratory made SiC Schottky diodes

In this paper results of measurements of thermometric characteristics of silicon carbide Schottky diodes are presented. Such characteristics are used to measure junction temperature of semiconductor devices by means of the indirect electrical method. The examined diodes are described and obtained results of thermal and electrical measurements are presented. The influence of measurement current on the thermometric characteristics is studied. Junctions' temperature estimation errors are in depth studied and described.

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2018 Baltic URSI Symposium (URSI)

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