{"title":"低损耗波导适配器的固有效率测量","authors":"C. L. Song, X. Liu, Qian Song","doi":"10.1109/ICMMT.2012.6230117","DOIUrl":null,"url":null,"abstract":"We employ two techniques to measure the intrinsic efficiency of a waveguide adapter used in a U band waveguide power standard. These two methods are based on one-port calibration. The results measured by this two techniques agree within 0.005 for efficiency one.","PeriodicalId":421574,"journal":{"name":"2012 International Conference on Microwave and Millimeter Wave Technology (ICMMT)","volume":"12 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2012-05-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Intrinsic efficiency measurement of low loss waveguide adapter\",\"authors\":\"C. L. Song, X. Liu, Qian Song\",\"doi\":\"10.1109/ICMMT.2012.6230117\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We employ two techniques to measure the intrinsic efficiency of a waveguide adapter used in a U band waveguide power standard. These two methods are based on one-port calibration. The results measured by this two techniques agree within 0.005 for efficiency one.\",\"PeriodicalId\":421574,\"journal\":{\"name\":\"2012 International Conference on Microwave and Millimeter Wave Technology (ICMMT)\",\"volume\":\"12 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2012-05-05\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2012 International Conference on Microwave and Millimeter Wave Technology (ICMMT)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICMMT.2012.6230117\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2012 International Conference on Microwave and Millimeter Wave Technology (ICMMT)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICMMT.2012.6230117","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Intrinsic efficiency measurement of low loss waveguide adapter
We employ two techniques to measure the intrinsic efficiency of a waveguide adapter used in a U band waveguide power standard. These two methods are based on one-port calibration. The results measured by this two techniques agree within 0.005 for efficiency one.